Contact resonance
force microscopy (CRFM) is an atomic force microscopy
(AFM) method that evolved from a curiosity about the detection of
ultrasonic vibrations with an AFM cantilever and an unaddressed need
to characterize the mechanical properties of stiffer materials (elastic
modulus >50 GPa). The method has matured to allow near-surface
and
subsurface elastic property measurements of single crystals, thin
films, nanomaterials, composites, and other advanced materials. More
recently, CRFM has been extended to viscoelastic property measurements,
where the CR frequency and CR quality factor are utilized to quantitatively
assess properties such as storage modulus, loss modulus, and loss
tangent. In this Perspective, we trace the evolution of CRFM from
initial discovery to elastic property measurements to viscoelastic
property measurements. The techniques for extending single-point property
measurements to two-dimensional property maps are then described in
terms of their operational characteristics, demonstrated on calibration
materials, and validated via comparisons to other viscoelastic measurement
tools. The focus of the discussion then shifts to viscoelastic CRFM
in nonambient conditions to highlight the challenges and developments
related to thermomechanical analyses and liquid operation. The current
state-of-the-art and best practices in data acquisition and analyses
for viscoelastic CRFM are elucidated via a step-by-step demonstration
on a wood–polymer composite. Finally, we conclude with a discussion
of potential polymer science application areas that are poised to
benefit from the recent advances in the ambient and nonambient CRFM
methodologies. Altogether, we feel that the recent addition of CRFM
to commercially available AFMs together with guides that clearly define
state-of-the-art and best practices will accelerate its acceptance
and adoption in polymer science via viscoelastic property measurements
at unprecedented length and time scales.