2017
DOI: 10.1021/acsami.7b15347
|View full text |Cite
|
Sign up to set email alerts
|

Modulation of Manganite Nanofilm Properties Mediated by Strong Influence of Strontium Titanate Excitons

Abstract: Hole-doped perovskite manganites have attracted much attention because of their unique optical, electronic, and magnetic properties induced by the interplay between spin, charge, orbital, and lattice degrees of freedom. Here, a comprehensive investigation of the optical, electronic, and magnetic properties of LaSrMnO thin films on SrTiO (LSMO/STO) and other substrates is conducted using a combination of temperature-dependent transport, spectroscopic ellipsometry, X-ray absorption spectroscopy, and X-ray magnet… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

0
6
0

Year Published

2019
2019
2024
2024

Publication Types

Select...
5

Relationship

1
4

Authors

Journals

citations
Cited by 6 publications
(6 citation statements)
references
References 56 publications
(69 reference statements)
0
6
0
Order By: Relevance
“…The absorption coefficient, α, of MoS 2 monolayer was extracted from parameters Ψ and Δ utilizing an air/MoS 2 /STO (or Al 2 O 3 ) multilayer model, where monolayer-MoS 2 consisted of a homogeneously uniform medium [14,23] and a composite heterointerface component. A. Woollam Co., Inc spectroscopic ellipsometer with photon energy of 0.6-4.5 eV was used to measure the ellipsometry parameters Ψ (the ratio between the amplitude of p and s-polarized reflected light) and Δ (the phase difference between p and s-polarized reflected light) in a high vacuum chamber with a base pressure of 1 × 10 −9 mbar.…”
Section: Methodsmentioning
confidence: 99%
See 4 more Smart Citations
“…The absorption coefficient, α, of MoS 2 monolayer was extracted from parameters Ψ and Δ utilizing an air/MoS 2 /STO (or Al 2 O 3 ) multilayer model, where monolayer-MoS 2 consisted of a homogeneously uniform medium [14,23] and a composite heterointerface component. A. Woollam Co., Inc spectroscopic ellipsometer with photon energy of 0.6-4.5 eV was used to measure the ellipsometry parameters Ψ (the ratio between the amplitude of p and s-polarized reflected light) and Δ (the phase difference between p and s-polarized reflected light) in a high vacuum chamber with a base pressure of 1 × 10 −9 mbar.…”
Section: Methodsmentioning
confidence: 99%
“…The substrate layers (bulk SrTiO 3 or Al 2 O 3 ) were also measured under the same conditions. The absorption coefficient, α, of MoS 2 monolayer was extracted from parameters Ψ and Δ utilizing an air/MoS 2 /STO (or Al 2 O 3 ) multilayer model, where monolayer‐MoS 2 consisted of a homogeneously uniform medium and a composite heterointerface component.…”
Section: Methodsmentioning
confidence: 99%
See 3 more Smart Citations