The observed performances of carbon nanotube field-effect transistors are examined using first-principles quantum transport calculations. We focus on the nature and role of the electrical contact of Au and Pd electrodes to open-ended semiconducting nanotubes, allowing the chemical contact at the surface to fully develop through large-scale relaxation of the contacting atomic configuration. As expected from their respective work functions, the Schottky barrier heights for Au and Pd turn out to be fairly similar for realistic contact models. We present, however, direct numerical evidence of Pd contacts exhibiting perfect transparency for hole injection as opposed to that of Au contacts. These findings support experimental data reported to date.The superb performances of carbon nanotube ͑CNT͒ field-effect transistors have been demonstrated over the past decade. 1-8 However, a number of factors determining the current-voltage ͑I-V͒ characteristics have to be clarified for extensive device applications. A key factor in this context is the Schottky barrier ͑SB͒ formed at the interface between the source and drain metallic electrodes and the CNT. Traditionally, Schottky contacts have been introduced to serve as passive ohmic contacts. However, Schottky contacts in CNT field-effect transistors play an active role in affecting the transistor action. For example, the drastic disparity of reported performances of CNT transistors has generally been attributed to the difficulty in controlling the position of the Fermi energy E F with respect to the valence and conduction bands of the CNTs, when they are brought into contact to metal electrodes via different fabrication processes. 9,10 The different E F locations should in turn give rise to different SB's and hence different I-V behaviors.In the simplest Mott and/or Schottky picture for metalsemiconductor interfaces, the potential barrier of electrons is dictated primarily by the difference between the metal E F and the CNT electron affinity. Accordingly, the gap of the semiconducting CNT, which is roughly inversely proportional to its diameter, is an important factor for determining the barrier for holes. Recently, a correlation has been shown between the diameter of the CNT and the on current for negative gate voltage of the device fabricated therein. Specifically, the on current increases with increasing CNT diameter. 11 Also, the work function of the metal electrodes has been shown to affect the device performance in a number of interesting ways. For instance, a metal electrode with a large work function, e.g., Pd, is shown to induce large on currents for holes, 12 while metal electrodes having small work functions, e.g., Al, enhance the on current of electrons. 13 When E F lies near the midgap for intermediate values of the work function, the device is shown to exhibit an ambipolar behavior. 3,7,13 Early theoretical work discussed the apparent validity of the Mott-Schottky picture in CNT transistors. 14 However, this simple picture cannot account for the general features ...