2011
DOI: 10.4071/isom-2011-wp1-paper4
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Molding Flow Modeling and Experimental Study on Void Control for Flip Chip Package Panel Molding with Molded Underfill Technology

Abstract: Increasing challenges are faced to ensure moldability with rapid advances in flip chip technology such as decreasing bump pitch and stand-off height, especially when commercial Moldable Underfill (MUF) is used and in particular, during panel level molding. One key challenge faced is severe void entrapment under the die. Experiments involving a large DOE matrix, which require significant time and process resources, are typically used to solve this issue. 3D flow simulation can be used to optimize the process to… Show more

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Cited by 6 publications
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