1998
DOI: 10.1088/0022-3727/31/1/002
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Molecular beam allotaxy: a new approach to epitaxial heterostructures

Abstract: The present status of a new epitaxial growth method, named molecular beam allotaxy (MBA), is reviewed. The method allows one to grow single-crystalline heterostructures in a new way; that is, the desired layer forms during annealing of a precipitate layer. The precipitates are embedded within a single-crystalline matrix, grown by molecular beam epitaxy. The key point is that the epitaxial growth of the matrix persists from the substrate through the spacings between the inclusions to the overlayer. The precipit… Show more

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Cited by 52 publications
(4 citation statements)
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“…14 where an approach is shown with a buried BL conductor directly underneath the three-terminal select transistor in which floating body effects have been extinguished. The transistor channel is grown through selective epitaxy [45] from largely monocrystalline silicon on top of a buried metal silicide acting as seed [46]- [50]. The use of a three-terminal vertical select transistor means that the space between the wordlines is available for a metal shield that would be tied to a fixed potential.…”
Section: Discussionmentioning
confidence: 99%
“…14 where an approach is shown with a buried BL conductor directly underneath the three-terminal select transistor in which floating body effects have been extinguished. The transistor channel is grown through selective epitaxy [45] from largely monocrystalline silicon on top of a buried metal silicide acting as seed [46]- [50]. The use of a three-terminal vertical select transistor means that the space between the wordlines is available for a metal shield that would be tied to a fixed potential.…”
Section: Discussionmentioning
confidence: 99%
“…As to the experimental details, as a first step, 18 nm, 40 nm, and 68 nm thick epitaxial CoSi 2 layers are grown on 4-inch mirror-polished n-type Si (001) wafers by a molecular beam allotaxy (MBA) method 10 . Microwave-plasma chemical-vapor deposition (MWPCVD) reactor equipped with a 3 kW generator and a direct current (DC) bias system was used for nucleation and growth of diamond on CoSi 2 .…”
Section: Methodsmentioning
confidence: 99%
“…First, we have grown a high quality single crystalline CoSi 2 layer with a thickness of 21 nm on a (1 0 0) oriented high resistivity (>1000 X cm) SOI substrate with a 25 nm top Si layer by Molecular beam allotaxy (MBA) [8]. The MBA process involves growth of a silicon buffer layer resulting in a final SOI-layer thickness of $54 nm.…”
Section: Device Fabricationmentioning
confidence: 99%