Molecular characterization of green lentil flours using synchrotron X-rays and Fourier transform mid-infrared techniques

Innovations in nondestructive assessment of baked products: Current trends and future prospects

“…The reconstructed 3D images of the sample can be analyzed to provide different quantitative parameters depicting the microstructural characteristics of the material. Some advantages of this technique over its counterparts include: (i) it provides clear images of the internal features of a material and enables deep penetration; (ii) samples can be scanned in situ; (iii) compared with MRI, light atomic force, and SEM, X‐ray μ‐CT requires little or no sample preparation; and (iv) when compared with SEM, both techniques can provide high‐resolution images of different types of samples (Sivakumar et al., 2022; Sivakumar, Findlay, et al., 2023; Sivakumar, Stobbs, et al., 2023). However, X‐ray μ‐CT can provide a 3D image for a relatively large volume, up to hundreds of millimeters, whereas SEM requires a relatively small sample and has limited scanning depth (Schoeman et al., 2016; van Dalen et al., 2007; Williams & Jia, 2003).…”

“…X‐rays from the desktop tubes are more readily available for study and research purposes than the synchrotron sources, but they produce noisy images and require longer image acquisition time. X‐rays from synchrotron sources produce less noisy and high‐resolution images and faster acquisition time and are more suitable for dynamic studies (Sivakumar, Stobbs, et al., 2023). However, synchrotron facilities’ limited availability makes them not readily accessible (Barigou & Douaire, 2013; Koksel et al., 2016; Olakanmi, Karunakaran, et al., 2023).…”