Molecular dynamics simulation of nanomanipulation based on AFM in liquid ambient

Korayem, M. H.; Hefzabad, R. N.; Homayooni, A.; Aslani, Hassan

doi:10.1007/s00339-016-0504-y

Cited by 8 publications

(4 citation statements)

References 28 publications

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“…Among such studies, some notable examples are as follows. In the MD simulation by Korayem et al [23], the manipulation of a Au nanoparticle by a Ag tip on a Ag substrate in the absence and presence of a water meniscus was studied. Jacobs et al [4] used a continuum model along with MD simulations and experimental TEM data to understand the effect of surface roughness on the pull-off force of H-saturated diamond tips.…”

Section: Introductionmentioning

confidence: 99%

A Classical Molecular Dynamics Study of the Effect of the Atomic Force Microscope Tip Shape, Size and Deformation on the Tribological Properties of the Graphene/Au(111) Interface

Maden,

Ustunel,

Toffoli

2024

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Atomic force microscopes are used, besides their principal function as surface imaging tools, in the surface manipulation and measurement of interfacial properties. In particular, they can be modified to measure lateral friction forces that occur during the sliding of the tip against the underlying substrate. However, the shape, size, and deformation of the tips profoundly affect the measurements in a manner that is difficult to predict. In this work, we investigate the contribution of these effect to the magnitude of the lateral forces during sliding. The surface substrate is chosen to be a few-layer AB-stacked graphene surface, whereas the tip is initially constructed from face-centered cubic gold. In order to separate the effect of deformation from the shape, the rigid tips of three different shapes were considered first, namely, a cone, a pyramid and a hemisphere. The shape was seen to dictate all aspects of the interface during sliding, from temperature dependence to stick–slip behavior. Deformation was investigated next by comparing a rigid hemispherical tip to one of an identical shape and size but with all but the top three layers of atoms being free to move. The deformation, as also verified by an indentation analysis, occurs by means of the lower layers collapsing on the upper ones, thereby increasing the contact area. This collapse mitigates the friction force and decreases it with respect to the rigid tip for the same vertical distance. Finally, the size effect is studied by means of calculating the friction forces for a much larger hemispherical tip whose atoms are free to move. In this case, the deformation is found to be much smaller, but the stick–slip behavior is much more clearly seen.

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Section: Introductionmentioning

confidence: 99%

A Classical Molecular Dynamics Study of the Effect of the Atomic Force Microscope Tip Shape, Size and Deformation on the Tribological Properties of the Graphene/Au(111) Interface

Maden,

Ustunel,

Toffoli

2024

Lubricants

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“…Magnetic force microscopy (MFM), as another important derivative technique of SFM, has realised to control magnetic particles (Liu et al, 2017b), which further expands the capability of SFM to manipulate various type of materials. Meanwhile, much attention have been paid to modelling and simulation for AFM manipulation based on molecular dynamics (Miyata et al, 2017;Korayem et al, 2016).…”

Section: Introductionmentioning

confidence: 99%

Direct manipulation of metallic nanosheets by shear force microscopy

Cai

Wang

et al. 2018

Journal of Microscopy

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Micro/nanomanipulation is a rapidly growing technology and holds promising applications in various fields, including photonic/electronic devices, chemical/biosensors etc. In this work, we present that shear force microscopy (ShFM) can be exploited to manipulate metallic nanosheets besides imaging. The manipulation is realized via controlling the shear force sensor probe position and shear force magnitude based on our homemade ShFM system under an optical microscopy for in situ observation. The main feature of the ShFM system is usage of a piezoelectric bimorph sensor, which has the ability of self-excitation and detection. Moreover, the shear force magnitude as a function of the spring constant of the sensor and setpoint is obtained, which indicates that operation modes can be switched between imaging and manipulation through designing the spring constant before experiment and changing the setpoint during manipulation process, respectively. We believe that this alternative manipulation technique could be used to assemble other nanostructures with different shapes, sizes and compositions for new properties and wider applications.

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“…AFM offers excellent precision in positioning and manipulation, which allows users to image nanosamples during the manipulation process. However, typical AFMs have only a single probe tip as the end-effector, which leads to severely inefficient nanomanipulation. , In addition, contact-mode manipulation using a sharp, hard AFM probe might cause damage to samples and substrates. , …”

Section: Introductionmentioning

confidence: 99%

“…30,31 In addition, contact-mode manipulation using a sharp, hard AFM probe might cause damage to samples and substrates. 32,33 Previous researchers have combined several techniques to achieve versatile nanomanipulation. Researchers have investigated the assembly of nanomaterials to AFM probes or sharp tips using tip-induced DEP, 34−37 which amply demonstrated that the nanomanipulation based on tip-induced DEP is flexible, efficient, and highly precise.…”

Section: Introductionmentioning

confidence: 99%

Spatial Manipulation and Assembly of Nanoparticles by Atomic Force Microscopy Tip-Induced Dielectrophoresis

Zhou

Yang

et al. 2017

ACS Appl. Mater. Interfaces

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In this article, we present a novel method of spatial manipulation and assembly of nanoparticles via atomic force microscopy tip-induced dielectrophoresis (AFM-DEP). This method combines the high-accuracy positioning of AFM with the parallel manipulation of DEP. A spatially nonuniform electric field is induced by applying an alternating current (AC) voltage between the conductive AFM probe and an indium tin oxide glass substrate. The AFM probe acted as a movable DEP tweezer for nanomanipulation and assembly of nanoparticles. The mechanism of AFM-DEP was analyzed by numerical simulation. The effects of solution depth, gap distance, AC voltage, solution concentration, and duration time were experimentally studied and optimized. Arrays of 200 nm polystyrene nanoparticles were assembled into various nanostructures, including lines, ellipsoids, and arrays of dots. The sizes and shapes of the assembled structures were controllable. It was thus demonstrated that AFM-DEP is a flexible and powerful tool for nanomanipulation.

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Molecular dynamics simulation of nanomanipulation based on AFM in liquid ambient

Cited by 8 publications

References 28 publications

A Classical Molecular Dynamics Study of the Effect of the Atomic Force Microscope Tip Shape, Size and Deformation on the Tribological Properties of the Graphene/Au(111) Interface

A Classical Molecular Dynamics Study of the Effect of the Atomic Force Microscope Tip Shape, Size and Deformation on the Tribological Properties of the Graphene/Au(111) Interface

Direct manipulation of metallic nanosheets by shear force microscopy

Spatial Manipulation and Assembly of Nanoparticles by Atomic Force Microscopy Tip-Induced Dielectrophoresis

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