Molecular dynamics simulations of buckling-induced plasticity

Durinck, J.; Coupeau, C.; Colin, Jérôme; Grilhé, J.

doi:10.1063/1.3033552

Cited by 17 publications

(3 citation statements)

References 22 publications

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“…The observation of circular buckles at large scales is thus a relevant marker of the occurrence of plastic events in the films. Such plastic events have been evidenced by molecular dynamic simulations (Durinck et al, 2008;Ruffini et al, 2013) and are characterized by a modified maximum deflection of buckles (as compared to a pure elastic response), in good agreement with experimental investigations on ductile films (Colin et al, 2009;Colin et al, 2007). Moreover, the combined effect of plastic events with a pressure mismatch mentioned previously (between the external and internal parts of the buckles) may now explain the formation of donut-and croissant-like structures (Hamade et al, 2015), experimentally observed on gold films in Fig.…”

Section: Donut-and Croissant-like Structure As Markers Of Both Pressu...supporting

confidence: 88%

Buckling Structures, A Relevant Signature of the Mechanical Properties of Film/Substrate Systems

2024

MPS

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Thin films and coatings are used in a wide range of technological applications, such as microelectronics, packaging or optics. They often develop high residual stresses during the deposition process, sometimes about few GPa in compression. Such large compressive stresses may cause the nucleation and growth of buckling structures that generally result in the loss of functional properties that were initially conferred to such film/substrate composites. The aim of our studies is consequently to have a better understanding of the buckling phenomenon, by identifying the relevant parameters to prevent, to limit, or to control its occurrence.

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Section: Donut-and Croissant-like Structure As Markers Of Both Pressu...supporting

confidence: 88%

Buckling Structures, A Relevant Signature of the Mechanical Properties of Film/Substrate Systems

2024

MPS

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“…A likely mechanism is the nucleation and/or evolution of dislocations at the compressed side of the silicon beam, 16 which can lead to a significant reduction in the deflection of buckled beams. 17 These irreversible processes result in a reduction of the flight distance to a stable value. Using a high-resolution optical microscope, we qualitatively observed changes in the beam shape before and after repetitive switching.…”

Section: ͪ ͑2͒mentioning

confidence: 99%

Buckling beam micromechanical memory with on-chip readout

Roodenburg

Spronck

Zant

et al. 2009

Applied Physics Letters

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We have used double clamped beams to implement a mechanical memory. Compressive stress is generated by resistive heating of the beams and beyond the buckling limit the bistable regime is accessed. Bits are written by applying lateral electrostatic forces. The state of the beam is read out by measuring the capacitance between beam and electrodes. Two ways to implement a mechanical memory are discussed: compensation of initial beam imperfections and snap through of the postbuckled beam. Although significant relaxation effects are observed, both methods prove reliable over thousands of write cycles.

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“…This method has been successfully used to resolve some problems related to vibration, bending and buckling stability of nanobeam [16]. However, post-buckling deformation of nanobeam is still unclear, and of great study interest in recent years [17][18][19][20]. Compared with stability, post-buckling deformation of nanobeam is much more difficult to be predicted [21].…”

Section: Introductionmentioning

confidence: 99%

A Simplified Model for Buckling and Post-Buckling Analysis of Cu Nanobeam Under Compression

Guo¹,

Xu²,

Jiang³

et al. 2020

Computer Modeling in Engineering &Amp; Sciences

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Both of Buckling and post-buckling are fundamental problems of geometric nonlinearity in solid mechanics. With the rapid development of nanotechnology in recent years, buckling behaviors in nanobeams receive more attention due to its applications in sensors, actuators, transistors, probes, and resonators in nanoelectromechanical systems (NEMS) and biotechnology. In this work, buckling and post-buckling of copper nanobeam under uniaxial compression are investigated with theoretical analysis and atomistic simulations. Different cross sections are explored for the consideration of surface effects. To avoid complicated high order buckling modes, a stressbased simplified model is proposed to analyze the critical strain for buckling, maximum deflection, and nominal failure strain for post-buckling. Surface effects should be considered regarding critical buckling strain and the maximum post-buckling deflection. The critical strain increases with increasing nanobeam cross section, while the maximum deflection increases with increasing loading strain but stays nearly the same for different cross sections, and the underlying mechanisms are revealed by our model. The maximum deflection is also influenced by surface effects. The nominal failure strains are captured by our simulations, and they are in good agreement with the simplified model. Our results can be used for helping design strain gauge sensors and nanodevices with self-detecting ability.

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Molecular dynamics simulations of buckling-induced plasticity

Cited by 17 publications

References 22 publications

Buckling Structures, A Relevant Signature of the Mechanical Properties of Film/Substrate Systems

Buckling Structures, A Relevant Signature of the Mechanical Properties of Film/Substrate Systems

Buckling beam micromechanical memory with on-chip readout

A Simplified Model for Buckling and Post-Buckling Analysis of Cu Nanobeam Under Compression

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