2017
DOI: 10.1016/j.apsusc.2017.03.043
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Molecular dynamics study of the nanosized droplet spreading: The effect of the contact line forces on the kinetic energy dissipation

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Cited by 7 publications
(1 citation statement)
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“…In this study, underfill simulation was performed under conditions involving solder bump arrangements and gap heights with a micro-scale characteristic length commonly used in the current semiconductor packaging field. LBM was utilized as the simulation method, and this LBM model improved the calculation ability of contact line friction and pressure in microbubbles based on previous studies [23], [24]. The differences in void generation behavior according to the bump pitch were observed, and the causes were identified based on the differences in the contact line movement mechanism according to the pitch.…”
Section: Introductionmentioning
confidence: 99%
“…In this study, underfill simulation was performed under conditions involving solder bump arrangements and gap heights with a micro-scale characteristic length commonly used in the current semiconductor packaging field. LBM was utilized as the simulation method, and this LBM model improved the calculation ability of contact line friction and pressure in microbubbles based on previous studies [23], [24]. The differences in void generation behavior according to the bump pitch were observed, and the causes were identified based on the differences in the contact line movement mechanism according to the pitch.…”
Section: Introductionmentioning
confidence: 99%