2014
DOI: 10.1063/1.4890246
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Molecular ferroelectric contributions to anomalous hysteresis in hybrid perovskite solar cells

Abstract: We report a model describing the molecular orientation disorder in CH 3 NH 3 PbI 3 , solving a classical Hamiltonian parametrised with electronic structure calculations, with the nature of the motions informed by ab-initio molecular dynamics. We investigate the temperature and static electric field dependence of the equilibrium ferroelectric (molecular) domain structure and resulting polarisability. A rich domain structure of twinned molecular dipoles is observed, strongly varying as a function of temperature … Show more

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Cited by 520 publications
(633 citation statements)
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“…Indeed, significant disorder was predicted, for example, for CH 3 NH 3 PbI 3 in ref. 37 from molecular dynamics simulations 37 .…”
Section: Resultsmentioning
confidence: 99%
“…Indeed, significant disorder was predicted, for example, for CH 3 NH 3 PbI 3 in ref. 37 from molecular dynamics simulations 37 .…”
Section: Resultsmentioning
confidence: 99%
“…Several authors have reported on this effect and speculated about the causes. [18][19][20][21][22] Some recent articles present cell designs that minimize this hysteresis. 23,24 In this article, we describe the hysteresis effect in additional detail.…”
Section: Introductionmentioning
confidence: 99%
“…In spite of the spectacular advances in cell efficiency many important aspects of the experimental observations on this system are not understood. Particularly intriguing is the hysteresis features in the response of the current density-voltage ( V J − ) curves [10][11][12][13] that have been related to a number of different explanations, as ferroelectric properties of the perovskite materials, [14][15][16] delayed electronic trapping processes, [17] or slow ion migration. [11,18,19] The recognition that the solar cell performance is heavily affected by time scale of the measurement and preconditioning procedures [9,17,20,21] has raised many concerns about the stability of the device and reliability for long time operation.…”
Section: Introductionmentioning
confidence: 99%