2016
DOI: 10.1002/aelm.201500380
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Molecular Orientation‐Dependent Bias Stress Stability in Bottom‐Gate Organic Transistors Based on an n‐Type Semiconducting Polymer

Abstract: Despite remarkable advances in the performances of organic field‐effect transistors (OFETs) in recent years, the bias stability of OFET devices remains a critical obstacle to their commercial use. The microstructural origins of charge traps inside OFET devices are not yet clearly understood, and investigating these origins presents an important challenge. The unique electrical properties of an n‐type semiconducting polymer, poly[[N,N′‐bis(2‐octyldodecyl)‐naphthalene‐1,4,5,8‐bis(dicarboximide)‐2,6‐diyl]‐alt‐5,5… Show more

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Cited by 19 publications
(20 citation statements)
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“…[7] With the development of P(NDI2OD-T2) -representing a milestone in the development of high performance electron conducting (i.e. n-channel) polymeric OFETs [6,8] extensive research has focused on understanding charge transport phenomena in NDI/thiophene-based donor/acceptor polymers in connection with thin-film microstructure, [9][10][11][12] molecular structure, [12][13][14] regioregularity, [15,16] molecular weight (MW), [17,18] side-chain engineering, [19,20] processing parameters, [21] annealing conditions, [22,23] high/low-k dielectrics, [24] ambipolarity, [25,26] contact resistance [27] as well as environmental stability. [28,29] As P(NDI2OD-T2)-based OFETs can be processed from a range of organic solvents, an equally important parameter is the nature of chain aggregation in solution, which is known to have a profound effect on thin-film microstructure properties.…”
Section: Introductionmentioning
confidence: 99%
“…[7] With the development of P(NDI2OD-T2) -representing a milestone in the development of high performance electron conducting (i.e. n-channel) polymeric OFETs [6,8] extensive research has focused on understanding charge transport phenomena in NDI/thiophene-based donor/acceptor polymers in connection with thin-film microstructure, [9][10][11][12] molecular structure, [12][13][14] regioregularity, [15,16] molecular weight (MW), [17,18] side-chain engineering, [19,20] processing parameters, [21] annealing conditions, [22,23] high/low-k dielectrics, [24] ambipolarity, [25,26] contact resistance [27] as well as environmental stability. [28,29] As P(NDI2OD-T2)-based OFETs can be processed from a range of organic solvents, an equally important parameter is the nature of chain aggregation in solution, which is known to have a profound effect on thin-film microstructure properties.…”
Section: Introductionmentioning
confidence: 99%
“…The development of P(NDI2OD‐T2) also represented a milestone in the development of high‐performance electron conducting (i.e., n‐channel) polymeric OFETs . Since the initial development of P(NDI2OD‐T2), extensive research has focused on understanding charge transport phenomena in NDI/thiophene‐based donor/acceptor polymers in connection with thin‐film morphology, tuning donor and/or acceptor units, side‐chain engineering, chain aggregation behavior in solution, processing parameters, annealing conditions, high/low‐k dielectrics, ambipolarity, as well as contact resistance . An important parameter of any polymer, however, is its molecular weight (MW), which, in the context of conjugated polymers, is known to have a profound effect on optoelectronic properties .…”
Section: Introductionmentioning
confidence: 99%
“…Representative gate voltage (V g )-drain current (I d ) transfer (recorded in saturation; drain voltage (V d ) = −100V) and V d -I d output characteristics for these OFETs are showed in Figure 6. OFETs mobilities were extracted in the saturation region using conventional fitting models [98] and Table 2 summarizes the transistor performance parameters including maximum and average mobility (μ max and μ avg ), threshold voltage (V th ) and current ON/OFF ratio (I ON /I OFF ). The μ max of SeBT (1, 1B, and 1C) based devices is 4.01, 0.60, and 0.09 cm 2 V −1 s −1 while the μ avg are 1.94 ± 0.90, 0.24 ± 0.18, and 0.03 ± 0.02 cm 2 V −1 s −1 , respectively.…”
Section: Charge Transport In Fetsmentioning
confidence: 99%