Molecular surface coverage standards by reference-free GIXRF supporting SERS and SEIRA substrate benchmarking
Eleonora Cara,
Philipp Hönicke,
Yves Kayser
et al.
Abstract:Non-destructive reference-free grazing incidence X-ray fluorescence (RF-GIXRF) is proposed as a highly effective analytical technique for extracting molecular arrangement density in self-assembled monolayers. The establishment of surface density standards through RF-GIXRF impacts various applications, from calibrating laboratory XRF setups to expanding its applicability in materials science, particularly in surface coating scenarios with molecular assemblies. Accurate determination of coverage density is cruci… Show more
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