Monitoring and diagnosing dependent process steps using VSI control charts

Yang, Su‐Fen; Chen, Wan-Yun

doi:10.1016/j.jspi.2010.11.030

Cited by 18 publications

(10 citation statements)

References 15 publications

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“…Shewhart control charts are used for the statistical control of processes and are widely used to monitor industrial fabrication processes and ensure good quality . Control charts are eminently suited to the monitoring of quality performances because they monitor whether a process is in‐control or out‐of‐control .…”

Section: Resultsmentioning

confidence: 99%

Fabrication of Al and Ga Co‐Doped ZnO Films on Flexible Substrates and Control Charts Monitor Deposition Process

Lin

2019

Physica Status Solidi (a)

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doped zinc oxide (AGZO) films are deposited onto flexible poly (ethylene terephthalate) (PET) substrates by radio frequency magnetron sputtering. Before the AGZO film coating, oxygen plasma etching is used to modify the surface of the PET substrate. The results show that the substrate is very hydrophilic. This study determines the effect of the deposition parameters on the structural, morphological, and optoelectronic performances of AGZO films. Based on the gray Taguchi analysis for the AGZO film coatings show that the electrical resistivity is decreased to 6.30 Â 10 À3 Ω cm and the optical transmittance is increased to 81.0%. The XRD diffraction and TEM images show that the AGZO films exhibit a hexagonal ZnO wurtzite structure. A comparison of the PET substrates that do or do not undergo plasma pretreatment, shows that the AGZO films coating there is a 4.7% improvement in elastic recovery, a 13.65% improvement in hardness H, a 1.69% improvement in the elastic modulus E, a 12.15% improvement in in H/E, and a 42.06% improvement in H 3 /E 2 . Shewhart control charts are used to monitor the deposition processes for the AGZO films. Finding shown that the deposition parameters for the films and process performance are in control and stable.

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Section: Resultsmentioning

confidence: 99%

Fabrication of Al and Ga Co‐Doped ZnO Films on Flexible Substrates and Control Charts Monitor Deposition Process

Lin

2019

Physica Status Solidi (a)

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“…However, we may be interested in detecting shifts in both the process mean and variance. Yang and Chen and Yang proposed the joint VSI

Ζ_{\overset{X}{true}} - Z_{S^{2}}

and

Ζ_{\overset{e}{true}} - Z_{S_{e}^{2}}

control charts to control the mean and variance of two dependent process steps.…”

Section: Adaptive Shewhart Control Chartsmentioning

confidence: 99%

Adaptive Control Charts: Recent Developments and Extensions

Psarakis

2015

Quality & Reliability Eng

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Statistical quality control is a very useful tool in the hands of business in order to improve their products quality. The control charts are the most widely used and the most effective tool of the statistical quality control. In this paper, the substantial recent developments in the design of the adaptive control charts, focusing on the univariate control charts, which allow some of their parameters to change during production, are presented.

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“…To simultaneously monitor the process mean and variance, several studies of adaptive control charts have suggested using adaptive rather than fixed control schemes, and other studies have proposed double or single adaptive charts . To enhance the ability of the proposed single FSI WL chart to detect out‐of‐control loss, a variable sampling interval (VSI) control scheme is included in the WL chart.…”

Section: Introductionmentioning

confidence: 99%

Monitoring and Diagnosing Process Loss Using a Weighted‐Loss Control Chart

Yang

Lin

2014

Quality & Reliability Eng

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Product and service quality and productivity loss are all crucial competitive factors of companies in numerous industries. The loss function is a popular method for measuring the loss caused by variations in product or service quality. This study proposes a weighted-loss (WL) control chart to monitor the loss variation among manufacturing or service processes. Because loss is caused by a quality variable deviating from its target value, we set up two corresponding control charts to diagnose the sources of out-of-control loss and implement processes to correct these losses. We further present a WL chart using optimal variable sampling intervals (VSIs) in order to detect out-of-control losses faster compared with a WL chart using a fixed sampling interval (FSI). An example then demonstrates and evaluates the ability of the proposed VSI WL control chart to monitor and diagnose out-of-control process loss. Numerical analyses indicate that the optimal VSI WL chart outperforms the FSI WL chart, the joint X and S 2 charts and the VSI Average Loss chart in detecting out-of-control process loss. Thus, the proposed VSI WL chart is recommended.

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Monitoring and diagnosing dependent process steps using VSI control charts

Cited by 18 publications

References 15 publications

Fabrication of Al and Ga Co‐Doped ZnO Films on Flexible Substrates and Control Charts Monitor Deposition Process

Fabrication of Al and Ga Co‐Doped ZnO Films on Flexible Substrates and Control Charts Monitor Deposition Process

Adaptive Control Charts: Recent Developments and Extensions

Monitoring and Diagnosing Process Loss Using a Weighted‐Loss Control Chart

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