2021
DOI: 10.1109/tpel.2021.3056648
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Monitoring of Gate Leakage Current on SiC Power MOSFETs: An Estimation Method for Smart Gate Drivers

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Cited by 18 publications
(8 citation statements)
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“…Compared with the method using anti‐parallel SBD, this method has smaller loop stray parameters [22]. Due to the unique carrier characteristics of BJT, certain pass‐through power consumption will be generated if the two push–pull circuits are directly short‐circuited, but the inducement of this pass‐through is essentially different from that of CMOS push–pull circuit.…”
Section: Amplification Circuitmentioning
confidence: 99%
See 2 more Smart Citations
“…Compared with the method using anti‐parallel SBD, this method has smaller loop stray parameters [22]. Due to the unique carrier characteristics of BJT, certain pass‐through power consumption will be generated if the two push–pull circuits are directly short‐circuited, but the inducement of this pass‐through is essentially different from that of CMOS push–pull circuit.…”
Section: Amplification Circuitmentioning
confidence: 99%
“…In addition, the input signals in the existing applications are all provided by external devices instead of digital chips, and signal waveforms usually need to be modulated, which affects the performance of isolated drivers in actual HT environments in terms of volume, device selection and so on. In [22], the leakage current monitor technology can help to assist the gate driver work in harsh environment. In [23], gate driver integration technology has been introduced.…”
Section: Introductionmentioning
confidence: 99%
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“…Such innovative communication channels allow this to reduce converter volume. Condition monitoring relies on accurately sensing power modules' precursors to aging, like gate leakage current [32] or temperature [33]. With accurate transistor modeling, component aging can be detected before its failure.…”
Section: The Half-bridge Modular Multilevel Convertermentioning
confidence: 99%
“…As a result, measurement for direct SoH estimation has gained high relevance. On-state voltage drop ( ) [5], threshold voltage ( ), thermal resistance ( ) [6], and gate leakage current ( ) [7] are amongst the main variables investigated in the literature.…”
Section: Introductionmentioning
confidence: 99%