2020
DOI: 10.23919/cjee.2020.000014
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Monitoring of SiC MOSFET junction temperature with on-state voltage at high currents

Abstract: A junction temperature monitoring method has been presented based on the on-state voltage at high currents. With a simplified physical model, this method mapped the relationship between junction temperature and on-state voltage. The tough calibration and signal sensing issues are solved. Verified by body-diode voltage detecting method, the presented method shows a good performance and high accuracy, in the meantime, it would not change the modulation strategy and topology of the converter.

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Cited by 15 publications
(4 citation statements)
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“…At present, there is no good method for the heating phenomenon inside the cable head [5]. At present, there is also a method of temperature monitoring through optical fiber conduction; since this method requires the temperature sensing element to be closely attached to the surface of the object to be measured, it belongs to contact measurement, and this will undoubtedly cause certain hidden dangers for the safe operation of highvoltage electrical equipment, especially outdoor high-voltage electrical equipment [6,7].…”
Section: Introductionmentioning
confidence: 99%
“…At present, there is no good method for the heating phenomenon inside the cable head [5]. At present, there is also a method of temperature monitoring through optical fiber conduction; since this method requires the temperature sensing element to be closely attached to the surface of the object to be measured, it belongs to contact measurement, and this will undoubtedly cause certain hidden dangers for the safe operation of highvoltage electrical equipment, especially outdoor high-voltage electrical equipment [6,7].…”
Section: Introductionmentioning
confidence: 99%
“…Temperature factors account for about 55% of power electronic system failures among various failure factors [3]. On-state voltage is considered a key parameter of power semiconductor devices, which is widely used as an indicator for device junction temperature (T j ) estimation and health monitoring [4], [5], [6], [7], [8]. Hence, accurately measuring V ds,on online to achieve T j detection and health status assessment is of great significance for improving the safety and reliability of the next-generation electric vehicles and preventing potentially catastrophic accidents.…”
Section: Introductionmentioning
confidence: 99%
“…Increasing the switching frequency is a simple approach for improving the performance of power converters, which can significantly reduce the volume and weight of the filters and increase the power density [9][10][11][12][13] . However, a high power density based on silicon (Si) devices is difficult to achieve by increasing the switching frequency because the performance of Si devices has reached their theoretical limitations [14][15][16][17] . In recent years, power converters based on Si devices have undergone remarkable upgrades with the usage of WBG devices, such as silicon carbide (SiC) and Gallium nitride (GaN) [18][19][20] , resulting in an increased junction operating temperature and higher switching speed capability [21] .…”
Section: Introductionmentioning
confidence: 99%