2017
DOI: 10.1021/acs.iecr.7b01106
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Monitoring of Wild Pseudomonas Biofilm Strain Conditions Using Statistical Characterization of Scanning Electron Microscopy Images

Abstract: Abstract:The present paper proposes a novel method of quantification of the variation in biofilm architecture, in correlation with the alteration of growth conditions that include, variations of substrate and conditioning layer. The polymeric biomaterial serving as substrates are widely used in implants and indwelling medical devices, while the plasma proteins serve as the conditioning layer. The present method uses descriptive statistics of FESEM images of biofilms obtained during a variety of growth conditio… Show more

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Cited by 7 publications
(3 citation statements)
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“…Understanding biofilm proliferation, development, processes and behavior under certain conditions is crucial in order to optimize and control the cultivated technological or biological system. Direct analysis of biofilm behavior or rather structure can be performed using different imaging techniques such as confocal laser scanning microscopy (CLSM), scanning electron microscopy (SEM) or atomic force microscopy (AFM) [8,[13][14][15]. While CLSM can be used for investigating the biofilm matrix composition (e.g., DNA and EPS) in a range of several micrometers, SEM together with energy-dispersive X-ray spectroscopy (EDX) examines biofilms up to 1 nm resolution including their elemental composition.…”
Section: Introductionmentioning
confidence: 99%
“…Understanding biofilm proliferation, development, processes and behavior under certain conditions is crucial in order to optimize and control the cultivated technological or biological system. Direct analysis of biofilm behavior or rather structure can be performed using different imaging techniques such as confocal laser scanning microscopy (CLSM), scanning electron microscopy (SEM) or atomic force microscopy (AFM) [8,[13][14][15]. While CLSM can be used for investigating the biofilm matrix composition (e.g., DNA and EPS) in a range of several micrometers, SEM together with energy-dispersive X-ray spectroscopy (EDX) examines biofilms up to 1 nm resolution including their elemental composition.…”
Section: Introductionmentioning
confidence: 99%
“…Studies related to the application of scanning electron microscopy (SEM) [30] and atomic force microscopy (AFM) [25,31] are of great importance, especially in fractal analysis. The authors of [25] studied the three-dimensional surface micromorphology of zinc/silverparticle-composite antibacterial coatings.…”
Section: Introductionmentioning
confidence: 99%
“…In order to optimize biofilm-technological processes it is necessary to understand biofilm proliferation and behavior under certain conditions. Direct analysis of bioflm behavior or rather structure can be performed using different imaging techniques such as confocal laser scanning microscopy (CLSM), scanning electron microscopy (SEM) or atomic force microscopy (AFM) (Allen, Habimana, & Casey, 2018;Azeredo et al, 2016;Bridier, Meylheuc, & Briandet, 2013;Dutta Sinha, Das, Tarafdar, & Dutta, 2017). While CLSM can be used for investigating the biofilm matrix composition (e.g., DNA and EPS) in a range of several micrometers, SEM together with energy-dispersive X-ray spectroscopy (EDX) examines biofilms up to 1 nm resolution and their elemental composition.…”
Section: Introductionmentioning
confidence: 99%