Monochromator operation in the carbon window region at the reflectometry beamline BL-11D of the Photon Factory

Hatano, Tadashi; Aihara, S.

doi:10.1088/1742-6596/425/15/152018

Cited by 6 publications

(2 citation statements)

References 2 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The diffraction efficiency of the 2400 lines/mm grating was measured by using the soft x-ray reflectometer installed at the BL-11D beamline of the Photon Factory (PF) in Japan. [24][25][26] Figure 3(a) indicates a schematic diagram of the measurement arrangement. The grating was located at the center of the reflectometer chamber.…”

Section: B Measurement Of the Gating Efficiencymentioning

confidence: 99%

See 1 more Smart Citation

Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm

Dinh

Kondo

Tamura

et al. 2016

Review of Scientific Instruments

Self Cite

View full text Add to dashboard Cite

A flat-field grazing incidence spectrometer operating on the spectral region from 1 to 10 nm was built for research on physics of high temperature and high energy density plasmas. It consists of a flat-field grating with 2400 lines/mm as a dispersing element and an x-ray charged coupled device (CCD) camera as the detector. The diffraction efficiency of the grating and the sensitivity of the CCD camera were directly measured by use of synchrotron radiation at the BL-11D beamline of the Photon Factory (PF). The influence of contamination to the spectrometer also was characterized. This result enables us to evaluate the absolute number of photons in a wide range wavelength between 1 and 10 nm within an acquisition. We obtained absolutely calibrated spectra from highly charged ion plasmas of Gd, from which a maximum energy conversion efficiency of 0.26% was observed at a Nd:YAG laser intensity of 3 × 10 W/cm.

show abstract

Section: B Measurement Of the Gating Efficiencymentioning

confidence: 99%

“…5(a). To minimize the influence of the impure light included in the beamline, 24,26 an Al filter with a thickness of 200 nm was used. A calibrated AXUV100G x-ray diode was used to determine the number of photons incident onto the x-ray CCD camera.…”

Section: Spectral Response Of the Ccd Cameramentioning

confidence: 99%