Monodomain strained ferroelectric<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mtext>PbTiO</mml:mtext></mml:mrow><mml:mn>3</mml:mn></mml:msub></mml:mrow></mml:math>thin films: Phase transition and critical thickness study

Venkatesan, Sriram; Vlooswijk, A.H.G.; Kooi, Bart J.; Morelli, Alessio; Palasantzas, G.; Hosson, J.Th.M. De; Noheda, Beatriz

doi:10.1103/physrevb.78.104112

Cited by 45 publications

(27 citation statements)

References 34 publications

(83 reference statements)

Supporting

Mentioning

Contrasting

Order By: Relevance

“…These crystallographic data indicate the presence of misfit strain at the interfaces. The TEM images show clearly that the PTO film is completely c-axis oriented without any a domains, which was also confirmed using x-ray diffraction 17 and it is in agreement with the claim previously from our PFM studies regarding the absence of a domains.…”

Section: A Tem Characterization and Analysissupporting

confidence: 80%

Piezoelectric properties of PbTiO3 thin films characterized with piezoresponse force and high resolution transmission electron microscopy

Morelli

Venkatesan

Kooi

et al. 2009

Journal of Applied Physics

Self Cite

View full text Add to dashboard Cite

In this paper we investigate the piezoelectric properties of PbTiO3 thin films grown by pulsed laser deposition with piezoresponse force microscopy and transmission electron microscopy. The as-grown films exhibit an upward polarization, inhomogeneous distribution of piezoelectric characteristics concerning local coercive fields, and piezoelectric coefficient. In fact, the data obtained reveal imprints during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited polarization reversal. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.

show abstract

Section: A Tem Characterization and Analysissupporting

confidence: 80%

Piezoelectric properties of PbTiO3 thin films characterized with piezoresponse force and high resolution transmission electron microscopy

Morelli

Venkatesan

Kooi

et al. 2009

Journal of Applied Physics

Self Cite

View full text Add to dashboard Cite

show abstract

“…There are only a few experimental determinations of the evolution of the misfit-strain with temperature [75,[97][98][99] whereas several evolutions of the complete set of lattice parameters evolution with temperature have been reported on Pb(Zr 1-x ,Ti x )O 3 thin films (e.g., see [100,101] for monodomain films and [79,82,83,102] for polydomain ones).…”

Section: Isotropic Biaxial Stress Fieldmentioning

confidence: 99%

“…5): the x,y and z axes (sometimes labeled with subscripts 1,2 and 3) are linked to the \100[ directions of the substrate, with the z (or 3) axis parallel to [001] substrate . The film is also supposed to be oriented so that [100] A comprehensive review on first-principles modeling of ferroelectric thin films was recently published by Ghosez and Junquera [104] and we refer the reader to it and to the review by Kornev et al [105] for a complete description of this field of intense research.…”

Section: Temperature-misfit Strain Phase Diagrams For Monodomain Filmsmentioning

confidence: 99%

See 1 more Smart Citation

Strain on ferroelectric thin films

Janolin

2009

J Mater Sci

View full text Add to dashboard Cite

Strain engineering aims to take advantage of the stress field imposed by substrates on thin films. It requires an understanding of the consequences of stress fields on the physical properties of the deposited materials. This is achieved in ferroelectric thin films through the use of misfit-strain phase diagrams that show the stability regions for the possible phases. These encompass bulk phases as well as new ones exhibiting symmetries that are not present in the bulk. For the solid solution lead zirconate-lead titanate, Pb(Zr 1-x Ti x )O 3 , monoclinic phases found in the bulk morphotropic phase boundary region and associated to concentrations exhibiting the highest properties can be stabilized on a wider range of composition in thin films. In addition, phases of lower symmetry can be stabilized through the use of anisotropic biaxial stress fields, generated by orthorhombic substrates for example. Another crucial aspect of the influence of biaxial stress fields is the generation of domain structures. Theoretical tools as well as experimental verifications have provided much insight on the underlying physics. We, therefore, present here an overview of the influence of both iso-and anisotropic biaxial stress fields on the structures and properties of ferroelectric thin films exemplified on Pb(Zr 1-x Ti x )O 3 .

show abstract

“…The absence of defects allows these domains to form in a very periodic fashion. 13,16 Interestingly, when the films are grown by pulsed laser deposition at high laser frequencies (10 Hz), extremely long domains are formed along one of the in-plane crystallographic directions, despite the very small difference in lattice parameters and thermal expansion coefficient of both in-plane lattice parameters of (110) , which we shall name a-axis and b-axis, respectively. The substrates exhibit double-terminated surfaces (with both DyO and ScO 2 surface layers), and they are chemically and thermally treated to get a single ScO 2 termination.…”

mentioning

confidence: 99%

Thickness scaling of ferroelastic domains in PbTiO3 films on DyScO3

Nesterov

Matzen

Magén

et al. 2013

Applied Physics Letters

View full text Add to dashboard Cite

We report on the thickness dependence of the ferroelastic domains of PbTiO 3 films grown on (110)-DyScO 3 with low thicknesses (up to 240 nm), which fall outside the validity range of the square root law proposed by Roytburd. For slow-grown films, the data reveal the linear thickness dependence predicted by Pertsev and Zembilgotov, using a complete elastic description, while a 2/3 scaling exponent is found for fast-grown films. Extremely long domains running all through the samples have been observed in the latter case, compared to the short domains observed in slow-grown films. These differences are ascribed to the in-plane anisotropy for domain wall nucleation, which is likely caused by the anisotropic elastic modulus of the substrate. V C 2013 AIP Publishing LLC.[http://dx.doi.org/10.1063/1.4823536]The response of domains and domain walls crucially affects (and often determines) the dielectric properties and switching behavior of ferroelectrics. This is particularly important in thin films where the ferroelectric (180 ) and ferroelastic (non-180 ) domain walls are formed in order to comply with the stringent electrical (large depolarizing field) and mechanical (substrate mismatch strain and clamping) boundary conditions.The size of the domains increases with increasing film thickness as a result of the balance between the depolarizing field energy (for 180 domains) 1 or elastic strain energy (for non-180 domains) 2 and the domain wall formation energy. Thus, the thinner the films, the larger the domain wall density and the greater the influence of the walls on the ferroelectric properties. Moreover, domain walls break spatial symmetry and could add functionalities to the films when present in large amounts. 3 It is therefore most relevant to have good control of the domain formation and the density of domain walls. 4 Domain formation in ferroelectrics has been largely studied. 2,3,[5][6][7][8][9][10][11][12][13][14][15] In order to adapt to the substrate and to locally minimize the mismatch strain or the depolarizing field, the domains form in a periodic manner. 6,7 It is known that there is a quadratic dependence, W / d 1=2 , of the domain width (W) with the crystal thickness (b). In ferroelastic domains (typically 90 domains), this b 1=2 dependence is an approximation in the regime of d ) W. 2 For smaller thicknesses, a linear dependence has been predicted by Pertsev and Zembilgotov (P&Z), 8 but it has not been experimentally confirmed yet.In this paper we investigate the thickness dependence of the periodicity of ferroelastic 90 domains (a/c twins) in the lower thickness regime using PbTiO 3 films grown on DyScO 3 substrates. This combination is chosen because there is a very small lattice mismatch between film and substrate at the growth temperature. This minimizes the formation of defects during growth. As the films are cooled down strain develops and can be relaxed by forming a/c domains. The absence of defects allows these domains to form in a very periodic fashion. 13,16 Interestingly, when the films...

show abstract

Monodomain strained ferroelectricPbTiO3thin films: Phase transition and critical thickness study

Cited by 45 publications

References 34 publications

Piezoelectric properties of PbTiO3 thin films characterized with piezoresponse force and high resolution transmission electron microscopy

Piezoelectric properties of PbTiO3 thin films characterized with piezoresponse force and high resolution transmission electron microscopy

Strain on ferroelectric thin films

Thickness scaling of ferroelastic domains in PbTiO3 films on DyScO3

Contact Info

Product

Resources

About