2021
DOI: 10.1109/ted.2021.3075425
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Monolithic Comparator and Sawtooth Generator of AlGaN/GaN MIS-HEMTs With Threshold Voltage Modulation for High-Temperature Applications

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Cited by 25 publications
(11 citation statements)
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“…The output V out of a comparator is high when V + > V – , and reversed, otherwise . As in Figure b, port V + of Comp#1 is pulled up via a 1 MΩ resistor R 14 and then V out1 is set high after power-up.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The output V out of a comparator is high when V + > V – , and reversed, otherwise . As in Figure b, port V + of Comp#1 is pulled up via a 1 MΩ resistor R 14 and then V out1 is set high after power-up.…”
Section: Resultsmentioning
confidence: 99%
“…The output V out of a comparator is high when V + > V − , and reversed, otherwise. 39 As in Figure 2b, port V + of Comp#1 is pulled up via a 1 MΩ resistor R 14 and then V out1 is set high after power-up. Consequently, the output Q of flip-flop is set to be high, which results in the output V trig of trigger circuit being set high most of the time after power-up.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…drivers). For this reason, monolithic integration of power GaN circuits is recently offered also as a foundry service and is still a hot industrial research topic [36], [37].…”
Section: B Maturity Of Wbg Materials Technologiesmentioning
confidence: 99%
“…[1][2][3][4][5][6][7][8][9] However, due to the fact that devices operate at high voltage and high frequency, parasitic inductance and capacitance affect the switching characteristics of devices, making it difficult to accurately model the switching process of GaN devices. [10][11][12][13][14][15] In recent years, there have been many studies of modeling the switching characteristics of GaN devices. Under high voltage and high frequency operating conditions, extremely high dv/dt and di/dt can produce serious oscillations on the gate and drain of GaN HEMTs, especially the risky gate oscillation, which may directly lead to the gate breakdown of the device.…”
Section: Introductionmentioning
confidence: 99%