Monte Carlo model for describing charge transfer in irradiated CCDs

Gallagher, Dennis J.; Demara, Raymond; Emerson, G.; Frame, Wayne W.; Delamere, A.

doi:10.1117/12.304563

Cited by 6 publications

(7 citation statements)

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“…Even if the CTI is known, the effect on imaging performance still has to be calculated. Several authors [102], [103] have developed models for predicting CCD performance for particular operating conditions, but care is still needed to extrapolate results to other situations. Even for high signal applications, where CTI damage is reduced, CCDs are restricted to displacement damage doses below 5 10 MeV/g.…”

Section: A Ccd Imagersmentioning

confidence: 99%

Radiation effects on photonic imagers-a historical perspective

Pickel

Kalma

Hopkinson³

et al. 2003

IEEE Trans. Nucl. Sci.

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Photonic imagers are being increasingly used in space systems, where they are exposed to the space radiation environment. Unique properties of these devices require special considerations for radiation effects. This paper summarizes the evolution of radiation effects understanding in infrared detector technology, charge coupled devices, and active pixel sensors. The paper provides a discussion of key radiation effects developments and a view of the future of the technologies from a radiation effects perspective.

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Section: A Ccd Imagersmentioning

confidence: 99%

Radiation effects on photonic imagers-a historical perspective

Pickel

Kalma

Hopkinson³

et al. 2003

IEEE Trans. Nucl. Sci.

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“…CTE models such as those presented by Dale et al. [2], Gallagher et al [5], and Janesick [6] can, with good accuracy, match the measured CTE response (using an Fe source) from pre and post proton irradiated CCDs, thereby validating the assumed trap properties. However, it will be shown that using the CTE values from such models to predict the image degradation (e.g., distortion or MTF) in an arbitrary image can yield inaccurate results.…”

Section: Introductionmentioning

confidence: 94%

“…The trap densities corresponding to this level of NIEL were estimated to be 2.58E9 #/cm for P-V and 5.16E9 #/cm for the V-V using expressions developed by Robbins [10]. In addition, an O-V trap density of 3.87E9 #/cm was used based on a linear scaling (with NIEL) of data reported by Gallagher [5].…”

Section: Setup and Validation Of Modelmentioning

confidence: 99%

“…The second configuration enables only the proportional loss CTE model, which applies a fixed CTE value per pixel of 0.999 920 to every pixel. The CTE value was determined using the model by Gallagher [5] and the parameters in Table I. The images produced in configuration two would result with the assumption that every pixel had the same level of CTE performance.…”

Section: Modeling Of the Kepler Detectormentioning

confidence: 99%

“…The quantity is calculated using [11] ( 8) and the values for listed in Table I were arrived at using both measured data and through comparisons with measured emission time-constant data [5], [6], [10].…”

Section: Software Modelmentioning

confidence: 99%

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Modeling the impact of preflushing on CTE in proton irradiated CCD-based detectors

Philbrick¹

2002

IEEE Trans. Nucl. Sci.

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A software model is described that performs a "real world" simulation of the operation of several types of charge-coupled device (CCD)-based detectors in order to accurately predict the impact that high-energy proton radiation has on image distortion and modulation transfer function (MTF). The model was written primarily to predict the effectiveness of vertical preflushing on the custom full frame CCD-based detectors intended for use on the proposed Kepler Discovery mission, but it is capable of simulating many other types of CCD detectors and operating modes as well. The model keeps track of the occupancy of all Phospho- rous-Silicon (P-V), Divacancy (V-V) and Oxygen-Silicon (O-V) defect centers under every CCD electrode over the entire detector area. The integrated image is read out by simulating every electrode-to-electrode charge transfer in both the vertical and horizontal CCD registers. A signal level dependency on the capture and emission of signal is included and the current state of each electrode (e.g., barrier or storage) is considered when distributing integrated and emitted signal. Options for performing preflushing, preflashing, and including mini-channels are available on both the vertical and horizontal CCD registers. In addition, dark signal generation and image transfer smear can be selectively enabled or disabled. A comparison of the charge transfer efficiency (CTE) data measured on the Hubble space telescope imaging spectrometer (STIS) CCD with the CTE extracted from model simulations of the STIS CCD show good agreement.Index Terms-Charge-coupled device (CCD), charge transfer efficiency (CTE), preflushing, proton.

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Modeling charge transfer inefficiency in the Chandra Advanced CCD Imaging Spectrometer

Townsley

Broos

Nousek

et al. 2002

Nuclear Instruments and Methods in Physics Research Section A:

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The front-illuminated (FI) CCDs in the Advanced CCD Imaging Spectrometer (ACIS) on the Chandra X-ray Observatory (Chandra) were damaged in the extreme environment of the Earth's radiation belts, causing charge traps that result in enhanced charge transfer inefficiency (CTI) during parallel readout. This causes row-dependent gain, event grade 'morphing' (spatial redistribution of charge) and energy resolution degradation.The ACIS back-illuminated (BI) CCDs also exhibit pronounced CTI due to their manufacturing. It is mild enough that position-dependent energy resolution is not seen, but it is present in both parallel and serial registers. This CTI also changes the gain and event grades, in a spatially complicated way as parallel and serial CTI interact.Given these realities, we have developed and tuned a phenomenological model of CTI for both FI and BI CCDs and incorporated it into our Monte Carlo simulations of the ACIS CCDs. It models charge loss and the spatial redistribution of charge (trailing), thus reproducing the spatially-dependent gain and grade distribution seen in all ACIS CCDs and the row-dependent energy resolution seen in the FI devices. Here we explore the evidence for CTI, compare our simulations to data, and present a technique for CTI correction based on forward modeling.

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Monte Carlo model for describing charge transfer in irradiated CCDs

Cited by 6 publications

References 0 publications

Radiation effects on photonic imagers-a historical perspective

Radiation effects on photonic imagers-a historical perspective

Modeling the impact of preflushing on CTE in proton irradiated CCD-based detectors

Modeling charge transfer inefficiency in the Chandra Advanced CCD Imaging Spectrometer

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