“…The ABMC simulation is based on the hard threshold dead space effect in the displaced exponential model of distribution of random ionizing path lengths. In the present article, the author puts forward a report of their study (Ghosh & Ghosh, 2008) of excess noise in heterojunction avalanche photodetector by Monte Carlo simulation. The MC simulation attracts much attention as it can investigate a device operation mechanism through carrier distribution dynamics and potential distribution profile.…”