Monte Carlo simulation study on secondary electron yield of SiO2

Guo, P.; Mao, S.F.; Zou, Y.B.; Yang, T.F.; Miao, H.; Ding, Z.J.

doi:10.1016/j.rinp.2024.107472

Results in Physics

2024

DOI: 10.1016/j.rinp.2024.107472

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Monte Carlo simulation study on secondary electron yield of SiO2

P. Guo,

S.F. Mao,

Y.B. Zou

et al.

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Monte Carlo simulation study on secondary electron yield of SiO2

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References 61 publications

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