2006
DOI: 10.2320/matertrans.47.52
|View full text |Cite
|
Sign up to set email alerts
|

Morphological Change in FePt Nanogranular Thin Films Induced by Irradiation with 2.4 MeV Cu<SUP>2+</SUP> Ions: Electron Tomography Observation

Abstract: Nanogranular thin films, in which FePt nannoparticles are dispersed in an amorphous 20 nm thick Al 2 O 3 layer, were irradiated with 2.4 MeV Cu 2þ ions up to 5 Â 10 19 ions/m 2 at room temperature. Electron tomography with a tilt series of bright-field transmission electron microscope images was employed to identify 3-dimensional structural changes due to irradiation. Electron tomography images have clearly revealed that the irradiation with 2.4 MeV Cu 2þ ions causes anisotropic deformation of FePt nanoparticl… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2009
2009
2014
2014

Publication Types

Select...
3
1

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(1 citation statement)
references
References 21 publications
0
1
0
Order By: Relevance
“…A 3D structure can be reconstructed by processing a tilt series of electron micrographs with massthickness contrasts, formed by several different imaging techniques: bright-field ͑BF͒ TEM, [6][7][8] dark field TEM, [9][10][11] atomic number ͑Z͒ contrast of STEM, [12][13][14] energy-filtered TEM, 13 and electron holography. A 3D structure can be reconstructed by processing a tilt series of electron micrographs with massthickness contrasts, formed by several different imaging techniques: bright-field ͑BF͒ TEM, [6][7][8] dark field TEM, [9][10][11] atomic number ͑Z͒ contrast of STEM, [12][13][14] energy-filtered TEM, 13 and electron holography.…”
Section: Introductionmentioning
confidence: 99%
“…A 3D structure can be reconstructed by processing a tilt series of electron micrographs with massthickness contrasts, formed by several different imaging techniques: bright-field ͑BF͒ TEM, [6][7][8] dark field TEM, [9][10][11] atomic number ͑Z͒ contrast of STEM, [12][13][14] energy-filtered TEM, 13 and electron holography. A 3D structure can be reconstructed by processing a tilt series of electron micrographs with massthickness contrasts, formed by several different imaging techniques: bright-field ͑BF͒ TEM, [6][7][8] dark field TEM, [9][10][11] atomic number ͑Z͒ contrast of STEM, [12][13][14] energy-filtered TEM, 13 and electron holography.…”
Section: Introductionmentioning
confidence: 99%