Morphology and multifractal characteristics of Ag–Cu films with N doping prepared by direct current magnetron sputtering method

Noorbakhsh, Razia; Rezaee, Sahar; Arghavani Nia, Borhan; Boochani, Arash

doi:10.1007/s11082-023-05158-0

Cited by 2 publications

(3 citation statements)

References 31 publications

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“…This phenomenon aligns with findings from previous research, emphasizing the pivotal role of nanoparticle size in governing surface dynamics (Noorbakhsh et al, 2023;Shakoury, Nahvifard, et al, 2023).…”

Section: Multifractal Analysissupporting

confidence: 91%

“…According to this diagram, it can be seen that the film surface of the nickel particles with an average size of 10-100 is accumulated on the substrates of steel, copper and aluminum. On the other hand, according to sources such as (Ahmadpourian et al, 2016;Noorbakhsh et al, 2023), it can be stated that the Gaussian diagram of each of the samples that have the smallest width and the points with the same height has a smoother surface as a result. This result is consistent with the data in Table 2.…”

Section: The Statistical Parameters For Samplesmentioning

confidence: 99%

“…Hence, in recent decades, various microscopes and analyzers have been developed on an experimental and computational basis, examining, and studying the surface morphology in more detail (Knápek et al, 2017;Knápek et al, 2019). Atomic force microscope (AFM) as the most well-known analytical tool has been widely used to investigate the surface morphology of thin films because of its high spatial resolution and cost-effectiveness compared to other microscopes (Noorbakhsh et al, 2023;Shakoury, Matos, et al, 2023;Solaymani et al, 2018;Ţ alu et al, 2015). The static data obtained from the defined software and the static parameters related to the surface have been reported.…”

Section: Introductionmentioning

confidence: 99%

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Investigation of microstructural, micromorphology, and surface plasmon resonance characteristics in Ni/Al, Ni/Cu, and Ni/SS thin films

Mohammadi,

Rezaee,

Nia

et al. 2024

Microscopy Res & Technique

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As the first boundary between the environment and the material, the surface plays an important role in their interaction with each other, therefore, the use of appropriate tools and analysis to examine the mechanical properties and morphology of surfaces has particular importance in industry and research. In this research, a thin film of nickel was deposited on metal substrates made of aluminum, copper, and steel by using the RF magnetic cathode. Then, using a non‐contact atomic force microscope, the morphological properties of the nickel film with static parameters, Minkowski functionals (MF's), fractal, and multifractal were extracted to be analyzed and studied. After that, using parameters such as root mean square (RMS) roughness, skewness, and kurtosis, it was determined how the surface roughness, distribution, and probability density of particles on the film surface alters with the change of the substrate. Next, by examining and analyzing the Δα and Δf parameters obtained from the multifractal section, the morphology of the produced film on the metal substrates was investigated. Then, the change in the surface plasmon resonance (SPR) peak position is changed for the prepared film in the range of the absorption spectrum due to the substrate effect and the microstructural properties of the formed film.Highlights Ni film has been deposited by Rf magnetron sputtering. The effect of metal substrates on the topography, fractality, and optical properties was studied. Minkowski functionals were used to investigate the surface morphology of the samples. Substrate's material and the topography of the formed film can changed the surface plasmon resonance position.

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Section: Multifractal Analysissupporting

confidence: 91%

Section: The Statistical Parameters For Samplesmentioning

confidence: 99%