2000
DOI: 10.1002/1097-4628(20001010)78:2<452::aid-app260>3.0.co;2-5
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Morphology characterization of high-impact resistant polypropylene using AFM and SALS

Abstract: Atomic force microscopy and small angle light scattering have been used to characterize the morphology of high‐impact polypropylene. Because of sample preparation requirements, both techniques are relatively simple compared with conventional electron microscopy approaches. Using atomic force microscopy the spatial distribution of the impact‐modifying ethylene‐propylene rubber (EPR) domains could be readily identified whereas small angle light scattering was used to quantify overall domain size distribution. EP… Show more

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Cited by 5 publications
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“…In addition to thin film study, there are also some reports on AFM investigations related to melt mixed polymer blend microstructures. , Blends of polypropylene (PP) with a compatible copolymer (such as ethylene−propylene (EP)) offer good interfacial and mechanical properties that permit micrometer and nanometer-scale structure investigations with AFM. Investigation of the EP dispersed phase reveals a complex structure presenting amorphous and crystalline regions of different chemical natures. Galuska et al studied a variety of bulk polymer blends using AFM and samples prepared by microtomy.…”
Section: Introductionmentioning
confidence: 99%
“…In addition to thin film study, there are also some reports on AFM investigations related to melt mixed polymer blend microstructures. , Blends of polypropylene (PP) with a compatible copolymer (such as ethylene−propylene (EP)) offer good interfacial and mechanical properties that permit micrometer and nanometer-scale structure investigations with AFM. Investigation of the EP dispersed phase reveals a complex structure presenting amorphous and crystalline regions of different chemical natures. Galuska et al studied a variety of bulk polymer blends using AFM and samples prepared by microtomy.…”
Section: Introductionmentioning
confidence: 99%