1989
DOI: 10.1109/16.30959
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MOSFET electron inversion layer mobilities - a physically based semi-empirical model for a wide temperature range

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Cited by 140 publications
(60 citation statements)
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“…The reduction of the transconductance peak in Figure 4 as a function of the temperature is explained by the mobility lowering due to increased phonon scattering at elevated temperatures. 8,9 Further, to confirm our results with a quantitative analysis, the extracted l 0 of the FinFETs is shown in Figure 5. The low-field mobility is extracted in linear regime (V ds ¼ À0.05 V) using the Y ¼ I ds /(g m ) 1/2 function method.…”
supporting
confidence: 58%
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“…The reduction of the transconductance peak in Figure 4 as a function of the temperature is explained by the mobility lowering due to increased phonon scattering at elevated temperatures. 8,9 Further, to confirm our results with a quantitative analysis, the extracted l 0 of the FinFETs is shown in Figure 5. The low-field mobility is extracted in linear regime (V ds ¼ À0.05 V) using the Y ¼ I ds /(g m ) 1/2 function method.…”
supporting
confidence: 58%
“…The decrease of threshold voltage (V th ) with temperature tends to increase drain current, while the reduction of mobility due to increase of phonon scattering with temperature tends to decrease drain current, same as in a conventional MOSFET. 8,9 The compensation of these opposing effects at V gs ¼ À0.8 V and at V gs ¼ À0.9 V for long and short devices, respectively, leads to unique points in the characteristics with zero temperature coefficient (ZTC). Inset of Figure 2(a) shows the output characteristics (I ds -V ds ) of long and short FinFETs at 25 C and at 150 C. These curves clearly show that the drive current of the FinFETs decreases with temperature as expected without any significant degradation after release.…”
mentioning
confidence: 99%
“…however, the reduced thermal velocity also reduces the screening effect [50], and this reduction in screening dominates the temperature dependence ( ). The electric field screening effect is also weakened by the reduced thermal velocity ( , not as in the limit).…”
Section: Temperature Effects In Semiconductorsmentioning
confidence: 99%
“…10, respectively. In a FinFET device, the decrease of threshold voltage with temperature tends to increase drain current in weak inversion while the mobility reduction causes a decrease in strong inversion [22,23]. A gate bias point exists when these opposing effects compensate each other, thus exhibiting the socalled ZTC (zero temperature coefficient) point [24,25].…”
Section: Device Simulation Using Silvaco-atlasmentioning
confidence: 99%