2005
DOI: 10.1016/j.commatsci.2004.07.006
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Motion of contact line of a crystal over the edge of solid mask in epitaxial lateral overgrowth

Abstract: Mathematical model that allows for direct tracking of the homoepitaxial crystal growth out of the window etched in the solid, pre-deposited layer on the substrate is described. The growth is governed by the normal (to the crystal-vapor interface) flux from the vapor phase and by the interface diffusion. The model accounts for possibly inhomogeneous energy of the mask surface and for strong anisotropies of crystal-vapor interfacial energy and kinetic mobility. Results demonstrate that the motion of the crystal-… Show more

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Cited by 5 publications
(2 citation statements)
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“…After the low-energy orientations (0 • and 90 • ) have been formed the time steps required to track the evolution become very small, and the computation is interrupted. (Of course, this is the drawback of the current model based on the evolution equation for the surface height; better model would employ the parametric representation of the surface and will allow surface slopes of the 90 • and larger [35]. I am presently working on such model.…”
Section: ǫ γ = 1/12mentioning
confidence: 99%
“…After the low-energy orientations (0 • and 90 • ) have been formed the time steps required to track the evolution become very small, and the computation is interrupted. (Of course, this is the drawback of the current model based on the evolution equation for the surface height; better model would employ the parametric representation of the surface and will allow surface slopes of the 90 • and larger [35]. I am presently working on such model.…”
Section: ǫ γ = 1/12mentioning
confidence: 99%
“…In this paper we describe a meshless particle method for computing evolving solid surfaces which are in contact with a material boundary (substrate) at all times [42,20,19]. In crystal growth such setup is universal, since all methods for thin film growth rely on deposition from the vapor phase or by means of atomic beams.…”
mentioning
confidence: 99%