2007 14th International Conference on Mixed Design of Integrated Circuits and Systems 2007
DOI: 10.1109/mixdes.2007.4286216
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Multi Background Memory Testing

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Cited by 11 publications
(9 citation statements)
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“…In the case of multibackground memory tests, backgrounds play a very important role in the final outcome. As was shown and investigated in (Yarmolik and Mrozek, 2007), different subsets of backgrounds can give different subsets of detectable faults for a selected memory test. The selection of an optimal set of backgrounds to get the highest fault coverage is still an open issue and there are no known algorithms for optimal background generation and construction in the case of more than four iterations of the test.…”
Section: Introductionmentioning
confidence: 94%
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“…In the case of multibackground memory tests, backgrounds play a very important role in the final outcome. As was shown and investigated in (Yarmolik and Mrozek, 2007), different subsets of backgrounds can give different subsets of detectable faults for a selected memory test. The selection of an optimal set of backgrounds to get the highest fault coverage is still an open issue and there are no known algorithms for optimal background generation and construction in the case of more than four iterations of the test.…”
Section: Introductionmentioning
confidence: 94%
“…. , m} as a metric were proposed and experimentally analysed in (Yarmolik and Mrozek, 2007). Based on this metric, the following statement was formulated and experimentally validated (Yarmolik and Mrozek, 2007;Yarmolik, 2008): This statement can be used for selecting the optimal values of background for memory tests generating only one pattern for k neighboring memory cells like the MATS+ and PS (4N) tests.…”
Section: Random Pairsmentioning
confidence: 99%
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