Multi-element characterization of silicon nitride powders by instrumental and radiochemical neutron activation analysis

Franek, M.; Kriváň, V.

doi:10.1016/0003-2670(92)87024-f

Cited by 8 publications

(2 citation statements)

References 20 publications

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“…The LODs expressed as three times the standard deviation (SD) of the blank control samples obtained from high-purity Si 3 N 4 are given in Table 3. The LODs are compared with those obtained by other methods (nebulization-ICP-OES (Neb-ICP-OES), 32 slurry Neb-ICP-OES, 3 slurry sample-electrothermal AAS (SS-ETAAS), 17 solution-ETAAS, 17 radiation neutron activation analysis (RNAA), 33 and ICP-MS 32 ). The superiority of our slurry nebulization technique is evident.…”

Section: Limits Of Detection (Lods)mentioning

confidence: 99%

Direct determination of trace impurities in high-purity silicon nitride by axial viewed inductively coupled plasma optical emission spectrometry using a slurry nebulization technique

Zheng

Zhang

Qiu

et al. 2015

J. Anal. At. Spectrom.

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Section: Limits Of Detection (Lods)mentioning

confidence: 99%

Direct determination of trace impurities in high-purity silicon nitride by axial viewed inductively coupled plasma optical emission spectrometry using a slurry nebulization technique

Zheng

Zhang

Qiu

et al. 2015

J. Anal. At. Spectrom.

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“…24 Also in the analysis of silicon nitride, both instrumental-and the radiochemical-NAA (INAA and RNAA, respectively) provide excellent LODs and accuracy. 25 However, because of the dependence on a nuclear reactor, they are unsuitable for routine analyses but are extremely important as a reference method.…”

Section: Introductionmentioning

confidence: 99%

Trace element analysis of silicon nitride powders by direct solid sampling graphite furnace atomic absorption spectrometry

Mattos

Flores

Kriváň

2008

J. Anal. At. Spectrom.

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A graphite furnace atomic absorption spectrometry method using direct solid sampling has been developed for the determination of Cr, Cu, Fe, K, Mn, Sb and Zn in powdered silicon nitride. Although during the atomization of all analytes excluding Zn, conversion of silicon nitride into silicon and silicon carbide was taking place and its essential part vaporized in the form of different species, no problems occurred with background correction. Calibration could be carried out by using calibration curves obtained with aqueous standard solutions. In the determination of Fe, before sampling, the platform bottom was covered with graphite powder in order to achieve quantitative vaporization and to increase the lifetime of the platform. For the latter reason, the use of graphite powder was advantageous in the determination of Cr and Cu, too. With sample masses up to about 2 mg applied per analysis cycle, the relative standard deviations were between 5 and 18% (n ¼ 5). For the most sensitive conditions, limits of detection between 0.1 (Zn) and 2 ng g À1 (Fe) are achievable. The accuracy was checked by comparison of the results with those of four other methods including neutron activation analysis whereby good to reasonable agreement was achieved.

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Multi-element characterization of silicon nitride powders by atomic and mass spectrometric solution methods

et al. 1994

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Multi-element characterization of silicon nitride powders by instrumental and radiochemical neutron activation analysis

Cited by 8 publications

References 20 publications

Direct determination of trace impurities in high-purity silicon nitride by axial viewed inductively coupled plasma optical emission spectrometry using a slurry nebulization technique

Direct determination of trace impurities in high-purity silicon nitride by axial viewed inductively coupled plasma optical emission spectrometry using a slurry nebulization technique

Trace element analysis of silicon nitride powders by direct solid sampling graphite furnace atomic absorption spectrometry

Multi-element characterization of silicon nitride powders by atomic and mass spectrometric solution methods

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