We demonstrate structured illumination microscopy (SIM) at three wavelengths using a digital mirror device (DMD), an approach which has not previously been realized due to the DMD’s blazed grating effect. Previous approaches to SIM using a DMD have used one color of coherent light or multiple colors via incoherent projection. To address this challenge, we develop a forward model of DMD diffraction, a forward model of coherent pattern projection, and identify an experimentally feasible configuration for three common fluorophore wavelengths. Based on these results, we constructed a custom DMD SIM and created an open-source software suite to simulate, calibrate, execute, and reconstruct 2D linear SIM data. We validate this approach by demonstrating resolution enhancement for known calibration samples and fixed cells.