Multi-Layer Material Characterization at Ka-Band Using Bayesian Inversion Method

Abstract

This paper presents the implementation of the Bayesian inversion method for the characterization and estimation of different dielectric material properties. The scattering parameters of single and multi-layer materials are measured using a free-space experimental setup using a standard gain horn antenna and a Vector Network Analyzer (VNA) at Ka-band (26–40 GHz). The relative permittivity, material thickness, and material positioning error are defined as model parameters and estimated using the observed (measured) data. The FR4 Epoxy, Rogers RT/Duriod 5880, and Rogers AD600 with different relative permittivities and thicknesses are used in the measurement setup. The results displayed good agreement between model parameters and estimated properties of the presented materials, while the corresponding eigenvectors provided a level of confidence in model parameter values. The results were compared with different reported techniques to showcase the possible use of the presented method in microwave imaging, non-destructive testing, and similar applications.

Resonator-Loaded Waveguide Notch Filters with Broad Tuning Range and Additive-Manufacturing-Based Operating Frequency Adjustment Procedure

“…The rapid growth of the telecommunications sector as well as the growing need for more effective, flexible multi-channel and multi-standard systems are driving the demand for tunable notch filters, which are key parts of RF communication systems [1][2][3]. These new applications are associated with requirements for high-performance devices, which are supposed to feature small sizes and low weights, exhibit a wide range of operating frequency tuning, and have efficient tuning mechanisms [4].…”