2008
DOI: 10.1088/0965-0393/16/6/065009
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Multi-scale characterization of orthotropic microstructures

Abstract: The public reporting burden for this collection of information is estimated to average 1 hour per response, including the time for reviewing instructions, searching existing data sources, searching existing data sources, gathering and maintaining the data needed, and completing and reviewing the collection of information. Send comments regarding this burden estimate or any other aspect of this collection of information, including suggestions for reducing this burden, to Department of Defense, Washington Headqu… Show more

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Cited by 29 publications
(16 citation statements)
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“…The images were generated using the algorithms detailed in Tschopp et al . (). The distributions of particle major axes were identical for each set of images composed of circles (Fig.…”
Section: Wavelet Spectra Of Some Idealized Casesmentioning
confidence: 97%
“…The images were generated using the algorithms detailed in Tschopp et al . (). The distributions of particle major axes were identical for each set of images composed of circles (Fig.…”
Section: Wavelet Spectra Of Some Idealized Casesmentioning
confidence: 97%
“…The framework of the study is inspired by pore-size probability distribution monitoring problems. To this aim, synthetic porous structures were generated by adapting the algorithm presented in Tschopp et al (2008). The output of the algorithm at each execution run is a 2D binary image where connected components (i.e., the pores) with fixed aspect ratio equal to 1 (i.e., circular pores) but random radius are spread within a square region of fixed size without overlapping (see Tschopp et al, 2008 for details).…”
Section: Simulation Studymentioning
confidence: 99%
“…The efficacy of the VMSAAF technique is demonstrated in this work by its application to synthetic two-dimensional microstructures generated by random sequential adsorption (RSA) without simulated annealing [11]. Particle characteristics were varied to produce microstructures with permutations of chosen factor levels, including: second-phase area fraction (A f = 10%, 20%, 30%), aspect ratio (AR = 4, 8, 16), and the alignment propensity of particle major axes-randomly oriented, fully aligned, or semi-aligned.…”
Section: Techniquementioning
confidence: 99%
“…1, where an array of square sub-regions (of edge-length Q) is used to sub-divide the material domain. Expressed as a coefficient of variation ( ), this variance of second-phase area fraction over all microstructure sub-regions has been shown to obey the relationship [11]: where A f is the second-phase area fraction, is a "cluster parameter" sensitive to the distribution of the second phase and the shape of the measuring sub-region (∼−1.0 for square sub-regions), andį s a "texture parameter" which is mainly sensitive to second-phase morphology and alignment. Since decreases as Q increases, any two-phase microstructure can be characterized by that length scale at which a specified minimum variation in A f is attained.…”
Section: Introductionmentioning
confidence: 99%
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