2012
DOI: 10.5875/ausmt.v2i2.149
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Multi-sensor Approach for Multivalent Applications in Nanometrology

Abstract: Abstract:The field of nanometrology is subject to increasing complexity as dimensional structures become more intricate with smaller structural widths and increasingly larger surface areas, and with the inclusion of thousands of inspection features. The relevant metrology tools thus need to provide the ability to measure in three dimensions with atomic resolution over large areas, and at a speed/throughput suitable for industrial applications. Ilmenau developed Nanopositioning and Nanomeasuring Technologies wi… Show more

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