“…The correlation between gradient direction is taken as the main measure, and the difference of Zernike moment and error ellipse is used as auxiliary parameters to realize fine matching, taking into account the matching success rate and computational efficiency (Ding, Tong, Qin, 2018). In addition to its application in landmark matching, feature line matching is often used to match multi-source remote sensing images with obvious edges and contours (Yu, Lu, Hu, 2013;Wang, Wang, Li, 2011;Li, Zhang, Zhang, 2019), such as SAR images and optical images (Xiang, Wang, You, 2018;Rui, Wang, Zhang, 2019), infrared images and optical images (Li, Jiang, Xu, 2015;Hu, Wang, Liu, 2013) . In these processes, feature line matching is transformed into feature point matching (Liu, Huo, Han, 2017;Song, 2014) and intensity-based registration (Liang, Liu, Huang, 2014;Moorthil, Sivakumar, 2018).…”