2011
DOI: 10.2478/s11534-011-0093-5
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Multiaxis interferometric displacement measurement for local probe microscopy

Abstract: Ê Ú ¾ ÂÙÒ ¾¼½½ ÔØ ½¾ ÇØÓ Ö ¾¼½½ ×ØÖ ØWe present an overview of design approaches for nanometrology measuring setups with a focus on interferometry techniques and associated problems. The design and development of a positioning system with interferometric multiaxis monitoring and control is presented. The system is intended to operate as a national nanometrology standard combining local probe microscopy techniques and sample position control with traceability to the primary standard of length.

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Cited by 12 publications
(22 citation statements)
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“…They measure vertical displacement and pitch and roll angles are evaluated from their differences. Interferometers monitor a single x displacement and y-position is measured by the two which gives the information about the third angle rotation according to the vertical axis (the yaw angle) [27]. The nanopositioning x-y-z stage is a PZT-driven system with 200 µm travel range in both x and y axes and 10 µm range in the vertical z axi loop displace range system…”
Section: Arrangement and Mechanicsmentioning
confidence: 99%
“…They measure vertical displacement and pitch and roll angles are evaluated from their differences. Interferometers monitor a single x displacement and y-position is measured by the two which gives the information about the third angle rotation according to the vertical axis (the yaw angle) [27]. The nanopositioning x-y-z stage is a PZT-driven system with 200 µm travel range in both x and y axes and 10 µm range in the vertical z axi loop displace range system…”
Section: Arrangement and Mechanicsmentioning
confidence: 99%
“…As most of the displacement measurements in industrial as well as fundamental metrology have been performed under atmospheric conditions where refractive index of air fluctuations play a dominant role as the source of uncertainty, there is not always the need to achieve the highest possible level of frequency stability [15,16]. The influence of refractive index of air can be evaluated with uncertainty down to the level of approximately 10 -7 [17].…”
Section: Introductionmentioning
confidence: 99%
“…Further, linear spectroscopy of molecular iodine is also an often used technique especially in case of interferometry applied at atmospheric conditions, where the influence of refractive index of air plays a dominant role [23][24][25][26][27]. Using this technique in combination with slow thermal tuning of the laser, the achievable frequency stability of frequency doubled Nd:YAG lasers is in the range of 10 -9 for 100 s integration time which is often two orders better than refractive index caused noise [28][29][30]. However, excellent optical frequency stability achieved by these lasers stabilized to molecular iodine vapor by high resolution spectroscopy can be further improved.…”
Section: Introductionmentioning
confidence: 99%