“…Since the changes in the dielectric permittivity tensor of the PSLC (PDLC) sample, caused by the recording processes, are small relative to the unperturbed state [31,32,33,34], it is possible to present the resulting distribution of perturbed dielectric permittivity tensor in the form:for PSLC – trueε^(boldnormalr,t)=false(1−sans-serifρfalse)[εp⋅trueI^+true∑m=o,eΔsans-serifε^pm(boldnormalr,t)]+sans-serifρ[sans-serifε^lc+true∑m=o,eΔsans-serifε^lcm(boldnormalr,t)+Δsans-serifε^lcpolfalse(boldnormalr,tfalse)], for PDLC – trueε^(boldnormalr,t)=false(1−sans-serifρfalse)[ε…”