2018
DOI: 10.3762/bjnano.9.161
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Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals

Abstract: In this work, methylammonium lead tribromide (MAPbBr3) single crystals are studied by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM). We demonstrate that the surface photovoltage and crystal photostriction can be simultaneously investigated by implementing a specific protocol based on the acquisition of the tip height and surface potential during illumination sequences. The obtained data confirm the existence of lattice expansion under illumination in MAPbBr3 and that nega… Show more

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Cited by 25 publications
(33 citation statements)
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“…This latter experiment helps distinguish work function change due to the SPV response from the slower, long lasting, decrease in the work function, which occurs simultaneously during the blue laser irradiation sequence. [19] Although the mechanism leading to the present surface degradation is still unclear, we can speculate that it is related to the degradation of other perovskite surfaces exposed to supragap irradiation in vacuum. [30,31] The sign of the SPV signal indicates that the sample exhibits a downward band bending of at least 90 meV.…”
Section: Surface Band Bendingmentioning
confidence: 99%
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“…This latter experiment helps distinguish work function change due to the SPV response from the slower, long lasting, decrease in the work function, which occurs simultaneously during the blue laser irradiation sequence. [19] Although the mechanism leading to the present surface degradation is still unclear, we can speculate that it is related to the degradation of other perovskite surfaces exposed to supragap irradiation in vacuum. [30,31] The sign of the SPV signal indicates that the sample exhibits a downward band bending of at least 90 meV.…”
Section: Surface Band Bendingmentioning
confidence: 99%
“…Surface band bending is detected using Kelvin probe force microscopy (KPFM) under various illumination conditions. [19] Using these data, an energy diagram of the material is drawn and general implications for RPPs are discussed. To our knowledge, this study represents the first comprehensive determination of the electronic levels of an n > 1 RPP perovskite.…”
Section: Introductionmentioning
confidence: 99%
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“…The surface photovoltage (SPV), which can be seen as a local measurement of V OC in semiconductors [ 12 ], has been studied using KPFM under modulated illumination. Indeed, the investigation of the SPV evolution as a function of a frequency-modulated excitation source can be used to access the photo-carrier dynamics in organic, inorganic and hybrid semiconductors [ 3 – 9 13 ]. In short, as depicted in Fig.…”
Section: Methodsmentioning
confidence: 99%
“…Thus, there is a need for correlative studies to link multiple nanoscale material properties. [ 2a,3f,12 ] In this work, we use the terminology correlation to establish the effect of one material property (e.g., chemical) on another (such as electrical). For example, recently, peak force infrared microscopy was implemented to relate local mechanical and chemical properties of a variety of materials, including perovskite crystals.…”
Section: Introductionmentioning
confidence: 99%