2007
DOI: 10.1117/12.715750
|View full text |Cite
|
Sign up to set email alerts
|

Multimode dynamics of atomic-force-microscope tip-sample interactions and application of sensitivity vector fields

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2008
2008
2011
2011

Publication Types

Select...
3

Relationship

1
2

Authors

Journals

citations
Cited by 3 publications
(1 citation statement)
references
References 0 publications
0
1
0
Order By: Relevance
“…For example, chaotic motions in tappingmode atomic force microscopy (AFM) have been studied, 28À31 and new operating algorithms using chaotic motions have also been discussed. These are based on sensitivity vector¯elds 29,30 or local°ow variations. 32 The increased use of AFM 33 also has been accompanied by rapid growth of various other cantilever-based sensing techniques.…”
Section: Introductionmentioning
confidence: 99%
“…For example, chaotic motions in tappingmode atomic force microscopy (AFM) have been studied, 28À31 and new operating algorithms using chaotic motions have also been discussed. These are based on sensitivity vector¯elds 29,30 or local°ow variations. 32 The increased use of AFM 33 also has been accompanied by rapid growth of various other cantilever-based sensing techniques.…”
Section: Introductionmentioning
confidence: 99%