Multimode Fiber Based Temperature Sensor with the Capability of Wavelength Encoding

Yan, 张滟 Zhang; Jianzhong, 张建中 Zhang; Zhihai, 刘志海 Liu; Weimin, 孙伟民 Sun; Libo, 苑立波 Yuan; Peng, Gang-Ding

doi:10.3788/aos20092902.0327

光学学报

2009

DOI: 10.3788/aos20092902.0327

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Multimode Fiber Based Temperature Sensor with the Capability of Wavelength Encoding

张滟 Zhang Yan¹,

张建中 Zhang Jianzhong²,

刘志海 Liu Zhihai³

et al.

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A Novel Atomic Force Microscope with Multi-Mode Scanner

Qin

Zhang

et al. 2016

J. Phys.: Conf. Ser.

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A new type of atomic force microscope (AFM) with multi-mode scanner is proposed. The AFM system provides more than four scanning modes using a specially designed scanner with three tube piezoelectric ceramics and three stack piezoelectric ceramics. Sample scanning of small range with high resolution can be realized by using tube piezos, meanwhile, large range scanning can be achieved by stack piezos. Furthermore, the combination with tube piezos and stack piezos not only realizes high-resolution scanning of small samples with large- scale fluctuation structure, but also achieves small range area-selecting scanning. Corresponding experiments are carried out in terms of four different scanning modes showing that the AFM is of reliable stability, high resolution and can be widely applied in the fields of micro/nano-technology.

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A Novel Atomic Force Microscope with Multi-Mode Scanner

Qin

Zhang

et al. 2016

J. Phys.: Conf. Ser.

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show abstract

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Multimode Fiber Based Temperature Sensor with the Capability of Wavelength Encoding

Cited by 1 publication

References 0 publications

A Novel Atomic Force Microscope with Multi-Mode Scanner

A Novel Atomic Force Microscope with Multi-Mode Scanner

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