Multiple soft fault diagnosis of DC analog CMOS circuits designed in nanometer technology

Tadeusiewicz, M.; Hałgas, Stanisław

doi:10.1007/s10470-016-0752-y

Cited by 7 publications

(6 citation statements)

References 25 publications

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“…For the last decades different fault verification techniques have been applied for soft and hard fault diagnosis in linear and nonlinear analogue circuits, e.g. [5,7,24,30,32]. Numerous works in the diagnosis area are devoted to the case when just one element is faulty, e.g.…”

Section: Introductionmentioning

confidence: 99%

Metrology and Measurement Systems

Tadeusiewicz¹,

Hałgas²

2018

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The paper deals with multiple soft fault diagnosis of analogue circuits. A method for diagnosis of linear circuits is developed, belonging to the class of the fault verification techniques. The method employs a measurement test performed in the frequency domain, leading to the nonlinear least squares problem. To solve this problem the Powell minimization method is applied. The diagnostic method is adapted to real circumstances, taking into account deviations of fault-free parameters and measurement uncertainty. Two examples of electronic circuits encountered in practice demonstrate that the method is efficient for diagnosis of middle-sized circuits. Although the method is dedicated to linear circuits it can be adapted to multiple soft fault diagnosis of nonlinear ones. It is illustrated by an example of a CMOS circuit designed in a sub-micrometre technology.

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Section: Introductionmentioning

confidence: 99%

Metrology and Measurement Systems

Tadeusiewicz¹,

Hałgas²

2018

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“…Recently several papers have been focused on multiple soft fault diagnosis in analog integrated circuits designed in micrometer and submicrometer technology, e.g. [23], [28][29].…”

Section: Introductionmentioning

confidence: 99%

“…Fault verification techniques have been applied for soft and hard fault diagnosis of analog circuits in the last decades, e.g. [4], [6], [19], [22][23], [27], [29][30][31]. Different methods and computational techniques have been developed to solve the corresponding diagnostic equations based on measurement test performed in DC, AC, or transient state.…”

Section: Introductionmentioning

confidence: 99%

International Journal of Electronics and Telecommunications

Tadeusiewicz

Ossowski

2018

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The paper deals with multiple soft fault diagnosis of linear analog circuits. A fault verification method is developed that allows estimating the values of a set of the parameters considered as potentially faulty. The method exploits the transmittance of the circuit and is based on a diagnostic test leading to output signal in discrete form. Applying Z-transform a diagnostic equation is written which is next reproduced. The obtained system of equations consisting of larger number of equations than the number of the parameters is solved using appropriate numerical approach. The method is adapted to real circumstances taking into account scattering of the fault-free parameters within their tolerance ranges and some errors produced by the method. In consequence, the results provided by the method have the form of ranges including the values of the tested parameters. To illustrate the method two examples of real electronic circuits are given.

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“…Several papers have been devoted to soft fault diagnosis of the process parameters in analog integrated circuits, e.g. [17][18][19].…”

Section: Introductionmentioning

confidence: 99%

“…[15,18,19], exploit a test leading to a system of algebraic equations expressing some measured node voltages in terms of the diagnosis parameters p 1 , … , p n . The circuit under test is driven by voltage or current sources applied to the nodes accessible for excitation.…”

Section: Introductionmentioning

confidence: 99%

A Systematic Method for Arranging Diagnostic Tests in Linear Analog DC and AC Circuits

Tadeusiewicz

Hałgas

2017

J Electron Test

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The paper deals with multiple soft fault diagnosis of linear analog circuits. The basic problem of arranging diagnostic tests performed in DC or AC states is considered in detail. A systematic method is developed that allows finding values of the sources applied to the excitation nodes as well as the measurement nodes at which the voltage variations due to the parameter deviations are sufficiently large. For this purpose the sensitivity analysis and the nonlinear programming technique, with appropriate objective function and constraints, are used. Four numerical examples reveal effectiveness of the proposed method for arranging the diagnostic tests.

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Multiple soft fault diagnosis of DC analog CMOS circuits designed in nanometer technology

Cited by 7 publications

References 25 publications

Metrology and Measurement Systems

Metrology and Measurement Systems

International Journal of Electronics and Telecommunications

A Systematic Method for Arranging Diagnostic Tests in Linear Analog DC and AC Circuits

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