2018
DOI: 10.1007/s10836-018-5703-3
|View full text |Cite
|
Sign up to set email alerts
|

Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit Design

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
6
0

Year Published

2018
2018
2023
2023

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 9 publications
(6 citation statements)
references
References 17 publications
0
6
0
Order By: Relevance
“…The manifestation of a short circuit fault at the output of the LUT node classifies it as checkable if this error is transmitted to the monitored result of calculations, i.e., if the node's LUT output is observable. Otherwise, the error does not reach the result, and this result is considered reliable [19].…”
Section: Improving the Checkability Of Schemes And Trustworthiness Of Resultsmentioning
confidence: 99%
“…The manifestation of a short circuit fault at the output of the LUT node classifies it as checkable if this error is transmitted to the monitored result of calculations, i.e., if the node's LUT output is observable. Otherwise, the error does not reach the result, and this result is considered reliable [19].…”
Section: Improving the Checkability Of Schemes And Trustworthiness Of Resultsmentioning
confidence: 99%
“…Additionally, the Boolean difference algorithm was used in previous studies [39, 40, 48, 49], and the maximal total number of test vectors is 2n$$ {2}^n $$ since all combination of inputs need to be considered. In Shah et al [50, 51], the maximal total number of test vectors is 3m$$ 3m $$, where m$$ m $$ is the number of product terms. Note that m$$ m $$ is always far greater than n$$ n $$ in real applications.…”
Section: A Stuck‐at Fault Diagnosis Algorithm For a Gate Network Base...mentioning
confidence: 99%
“…We have performed two experiments to validate the proposed algorithm in this study. The first is an illustration example found in Shah et al [51] to elaborate Algorithm 2. The second experiment addresses the 4‐bit carry look‐ahead adder circuit.…”
Section: Numerical Examplesmentioning
confidence: 99%
“…ROBDD can be obtained by removing redundancy nodes and isomorphism sub-graphs of Ordered Binary Decision Diagram (OBDD) [13], [14]. Although OBDD can be used as the regular expression of logic circuits, its structure is not necessarily the simplest because OBDD may have redundancy nodes or isomorphism sub-graphs.…”
Section: B Robddmentioning
confidence: 99%