1986
DOI: 10.1364/josaa.3.001794
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Multiple-wavelength ellipsometry in thin uniaxial nonabsorbing films

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Cited by 18 publications
(27 citation statements)
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“…Experiments at different wavelengths were proposed to obtain sufficient data . However, it turned out that unique characterization of uniaxial thin films by multiple wavelength ellipsometry is only possible if both the substrate and the incident medium are highly dispersive …”
Section: Resultsmentioning
confidence: 99%
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“…Experiments at different wavelengths were proposed to obtain sufficient data . However, it turned out that unique characterization of uniaxial thin films by multiple wavelength ellipsometry is only possible if both the substrate and the incident medium are highly dispersive …”
Section: Resultsmentioning
confidence: 99%
“…Figure (c) showed a different behavior, whereas the value of Δ n was fluctuating by increasing or decreasing over the applied spectral range. Such kind of optical behavior indicates that the PVK polymer film is not optically uniaxial, and hence, the net result for the differences in the refractive indices Δ n was either increasing or decreasing upon absorption of PNT vapor molecules . The existence of more than one unique optical axis in the polymer film led to the interference between the transmitted lights from the sample, resulting in either inphase constructive interaction, and hence the value of Δ n increased or out of phase destructive interaction, and hence the value of Δ n decreased.…”
Section: Resultsmentioning
confidence: 99%
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“…5A, 6A decreases again. At first glance, this is rather surprising since the ellipsometric 6A is known to be more sensitive to refractive index than to film thickness (19). Since the length of the hydrophobic moieties of both components Chl a and DGDG are comparable, it can be assumed that the film thickness is constant at a given surface pressure, and independent of the species in excess.…”
Section: Discussionmentioning
confidence: 99%