2007
DOI: 10.1364/ao.46.005667
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Multipoint phase calibration for improved compensation of inherent wavefront distortion in parallel aligned liquid crystal on silicon displays

Abstract: The inherent distortion of a reflective parallel aligned spatial light modulator (SLM) may need compensation not only for the backplane curvature but also for other possible nonuniformities caused by thickness variations of the liquid crystal layer across the aperture. First, we build a global look-up table (LUT) of phase modulation versus the addressed gray level for the whole device aperture. Second, when a lack of spatial uniformity is observed, we define a grid of cells onto the SLM aperture and develop a … Show more

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Cited by 94 publications
(58 citation statements)
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“…Strictly speaking, a lateral derivative of this error is added to the observed pattern. Taking into account that the typical errors due to the curvature are of the order of λ over the area of a typical SLM [9][10][11][12], and also that a typical aperture can contain approximately 1000 elementary cells in one direction, the magnitude of this error over one elementary cell can be evaluated as being of order of λ/1000. As an important practical consideration, the observation should be performed in the first Fresnel plane, where the shear value is the smallest and thereby this residual phase error is also minimum.…”
Section: Resultsmentioning
confidence: 99%
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“…Strictly speaking, a lateral derivative of this error is added to the observed pattern. Taking into account that the typical errors due to the curvature are of the order of λ over the area of a typical SLM [9][10][11][12], and also that a typical aperture can contain approximately 1000 elementary cells in one direction, the magnitude of this error over one elementary cell can be evaluated as being of order of λ/1000. As an important practical consideration, the observation should be performed in the first Fresnel plane, where the shear value is the smallest and thereby this residual phase error is also minimum.…”
Section: Resultsmentioning
confidence: 99%
“…In all cases, it is critical to perform an experimental determination of the spatial phase distribution of the SLM as a function of the parameter that controls the signal applied to the device (typically, the gray-level of the image displayed by commercial LC devices). A lack of spatial uniformity in the phase response of a SLM can appear due to addressing errors or to factors that are voltage-independent, as, for example, the curvature of the surface device, which causes variations in the LC thickness [8][9][10]. In the case of widespread used liquid crystal on silicon (LCoS) displays, the reflected wavefronts can be distorted by the curvature of the silicon backplane [9][10][11].…”
Section: Introductionmentioning
confidence: 99%
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“…The reconstructed images were recorded and processed with the use of a SP620-USB CCD-camera of Spiricon Inc. with a high dynamic range. As known (Oton et al, 2007), the spatial calibration of reflective LCoS SLM is essential for the correct use of the modulator in applications with high requirements of the wavefront control. We determined the additional phase 2D-distribution compensating the distortions of a wave front which appear due to the imperfection of SLM (backplane curvature, thickness variations of the liquid crystal layer across the aperture of the SLM, and so on) and elements of the optical system, by using the interference-based method proposed by Oton et al (2007).…”
Section: Optical-digital Systemmentioning
confidence: 99%
“…The SLM curvature was measured using a Michelson interferometer, and was corrected for in the experiment. 10 During the recording stage, a focused US transducer (Olympus NDT, V324-SU) emitted 800-ns US pulses repeatedly every 30 ls into the sample. The focal length of the US transducer was 14 mm.…”
mentioning
confidence: 99%