Multiscale 3D characterization with dark-field x-ray microscopy

Simons, Hugh; Jakobsen, Anders Clemen; Ahl, Sonja Rosenlund; Detlefs, C.; Poulsen, Henning Friis

doi:10.1557/mrs.2016.114

Cited by 51 publications

(29 citation statements)

References 38 publications

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“…In addition to creating the magnified image, passing the diffracted x-rays through the x-ray objective lens also avoids the blurring from strain observed in conventional x-ray section topography and excludes stray diffraction signals from other grains in the sample. Scanning the sample tilt (a,b) and scattering (2q) angles, we were able to reconstruct maps of the local {002} lattice spacing (e33 strain component) ( Figure 2B) and orientation ( Figure 2C) with a spatial, orientation and strain resolution of 100-200 nanometers, 1 milliradian and 10 -5 , respectively [23]. While only the axial strain is measured directly, the assumption of a coherent lattice implies that the two components of lattice inclination (i.e.…”

Section: Mapping Strain and Structure With Dark-field X-ray Microscopymentioning

confidence: 99%

Long-range symmetry breaking in embedded ferroelectrics

et al. 2018

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The characteristic functionality of ferroelectric materials is due to the symmetry of their crystalline structure. As such, ferroelectrics lend themselves to design approaches that manipulate this structural symmetry by introducing extrinsic strain. Using in situ dark-field X-ray microscopy to map lattice distortions around deeply embedded domain walls and grain boundaries in BaTiO, we reveal that symmetry-breaking strain fields extend up to several micrometres from domain walls. As this exceeds the average domain width, no part of the material is elastically relaxed, and symmetry is universally broken. Such extrinsic strains are pivotal in defining the local properties and self-organization of embedded domain walls, and must be accounted for by emerging computational approaches to material design.

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Section: Mapping Strain and Structure With Dark-field X-ray Microscopymentioning

confidence: 99%

Long-range symmetry breaking in embedded ferroelectrics

et al. 2018

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“…With a numerical aperture of order 1 mrad, CRL-based objectives are well matched to the high brilliance of synchrotron beams. A range of methodologies have been developed: magnified bright-field imaging (Lengeler et al, 1999), Zernike contrast microscopy (Falch et al, 2018), high-resolution microscopy for imaging colloidal aggregates (Bosak et al, 2010) and dark-field microscopy, where orientation and strains of deeply embedded grains or domains are mapped in three dimensions (Simons et al, 2015(Simons et al, , 2016. At the same time, direct space imaging can be complemented by diffraction in the back focal plane (Bosak et al, 2010;Ershov et al, 2013).…”

Section: Introductionmentioning

confidence: 99%

The fractional Fourier transform as a simulation tool for lens-based X-ray microscopy

Pedersen

Simons

Detlefs

et al. 2018

J Synchrotron Radiat

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The fractional Fourier transform (FrFT) is introduced as a tool for numerical simulations of X-ray wavefront propagation. By removing the strict sampling requirements encountered in typical Fourier optics, simulations using the FrFT can be carried out with much decreased detail, allowing, for example, on-line simulation during experiments. Moreover, the additive index property of the FrFT allows the propagation through multiple optical components to be simulated in a single step, which is particularly useful for compound refractive lenses (CRLs). It is shown that it is possible to model the attenuation from the entire CRL using one or two effective apertures without loss of accuracy, greatly accelerating simulations involving CRLs. To demonstrate the applicability and accuracy of the FrFT, the imaging resolution of a CRL-based imaging system is estimated, and the FrFT approach is shown to be significantly more precise than comparable approaches using geometrical optics. Secondly, it is shown that extensive FrFT simulations of complex systems involving coherence and/or non-monochromatic sources can be carried out in minutes. Specifically, the chromatic aberrations as a function of source bandwidth are estimated, and it is found that the geometric optics greatly overestimates the aberration for energy bandwidths of around 1%.

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“…the crystallographic planes and directions in which dislocation glide leads to a permanent shape change of the crystal. The 3DXRD technique is not yet capable of monitoring gliding dislocations in each grain of a polycrystal, although progress in this direction is rapid [24]. The lattice rotation associated with the plastic deformation may, however, be monitored and employed to deduce the active slip systems.…”

Section: Introductionmentioning

confidence: 99%

Measured resolved shear stresses and Bishop-Hill stress states in individual grains of austenitic stainless steel

et al. 2017

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Multiscale 3D characterization with dark-field x-ray microscopy

Abstract: Abstract

Cited by 51 publications

References 38 publications

Long-range symmetry breaking in embedded ferroelectrics

Long-range symmetry breaking in embedded ferroelectrics

The fractional Fourier transform as a simulation tool for lens-based X-ray microscopy

Measured resolved shear stresses and Bishop-Hill stress states in individual grains of austenitic stainless steel

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