2017
DOI: 10.1038/s41598-017-06976-5
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Multiscale correlative tomography: an investigation of creep cavitation in 316 stainless steel

Abstract: Creep cavitation in an ex-service nuclear steam header Type 316 stainless steel sample is investigated through a multiscale tomography workflow spanning eight orders of magnitude, combining X-ray computed tomography (CT), plasma focused ion beam (FIB) scanning electron microscope (SEM) imaging and scanning transmission electron microscope (STEM) tomography. Guided by microscale X-ray CT, nanoscale X-ray CT is used to investigate the size and morphology of cavities at a triple point of grain boundaries. In orde… Show more

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Cited by 42 publications
(25 citation statements)
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“…Loading colour map is unnormalised between maps to show contrast 2 . No PC strongly contributes to the highlighted grain (1)(2)(3)(4)(5)(6), and the VARIMAX rotated component that most loads it (f) includes significant signal from several other precipitates and matrix. This results in the corresponding RC-EBSP being dominated by FCC Co signal, and indexing accordingly (point C in Figure 7).…”
Section: Full Dataset Processing and Assignment Artefactsmentioning
confidence: 99%
“…Loading colour map is unnormalised between maps to show contrast 2 . No PC strongly contributes to the highlighted grain (1)(2)(3)(4)(5)(6), and the VARIMAX rotated component that most loads it (f) includes significant signal from several other precipitates and matrix. This results in the corresponding RC-EBSP being dominated by FCC Co signal, and indexing accordingly (point C in Figure 7).…”
Section: Full Dataset Processing and Assignment Artefactsmentioning
confidence: 99%
“…A volume with approximate dimensions 175 x 175 x 200 µm 3 containing the majority of the EIC crack of interest was lifted out using an FEI Helios Xe + Plasma Focused ion beam (PFIB), further details of this technique can be found elsewhere (Burnett et al, 2017) (Slater et al, 2017) (Gillen et al, 2018). After extraction, the block was attached to a Cu transmission electron microscopy (TEM) grid.…”
Section: Post-mortem Characterizationmentioning
confidence: 99%
“…In this paper a correlative XCT approach (Burnett et al, 2016) (Burnett et al, 2014) (Burnett et al, 2017) (Slater et al, 2017) combining time-lapse synchrotron XCT during slow strain rate testing (SSRT) followed by site-specific post-mortem analysis was performed to study the EIC initiation and propagation to failure of an AA5083 H131 alloy.…”
Section: Introductionmentioning
confidence: 99%
“…14 Over the last few years, analytical tomography has thereby become an important characterization method in nanoscale materials science. 13,[15][16][17][18] The 3D resolution of a sinogram is generally limited by the number of projections which can be acquired in an experiment and by the achievable tilt range. Reasons for these limitations are the overall dose the sample can sustain, the accuracy of the sample positioning mechanism for very small tilt steps, the geometry of the sample or the sample holder, as well as the limited time for an experiment.…”
Section: Introductionmentioning
confidence: 99%