2016
DOI: 10.1016/j.ultramic.2015.12.008
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Multiscale differential phase contrast analysis with a unitary detector

Abstract: Chuvilin, Multiscale differential phase contrast analysis with a unitary detector, Ultramicroscopy, http://dx.doi.org/10. 1016/j.ultramic.2015.12.008 This is a PDF file of an unedited manuscript that has been accepted for publication. As a service to our customers we are providing this early version of the manuscript. The manuscript will undergo copyediting, typesetting, and review of the resulting galley proof before it is published in its final citable form. Please note that during the production process … Show more

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Cited by 20 publications
(19 citation statements)
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“…The observations from the MFM images agree with the previously obtained MOKE results (Figure 10) and confirm the single domain structure of the nanowire [41]. Several other techniques exist such as Lorentz microscopy [65], modified differential phase contrast microscopy [66], photoemission electron microscopy (PEEM) combined with X-ray magnetic circular dichroism (XMCD) [67,68], and electron holography [69], which are powerful characterization tools that can yield highly valuable local magnetic information.…”
Section: Magnetic Imagingsupporting
confidence: 87%
“…The observations from the MFM images agree with the previously obtained MOKE results (Figure 10) and confirm the single domain structure of the nanowire [41]. Several other techniques exist such as Lorentz microscopy [65], modified differential phase contrast microscopy [66], photoemission electron microscopy (PEEM) combined with X-ray magnetic circular dichroism (XMCD) [67,68], and electron holography [69], which are powerful characterization tools that can yield highly valuable local magnetic information.…”
Section: Magnetic Imagingsupporting
confidence: 87%
“…The detailed description of the method together with the approach to quantify the nanoscale magnetic field can be found in Ref. 39 There we demonstrated the very high spatial resolution of the VBF DPC method (around 4 nm) and its high sensitivity to magnetic fields (the signal measured could be better than 0.01 T depends on the experimental conditions).…”
Section: Methodsmentioning
confidence: 76%
“…Since the diffraction patterns contain a large variety of information this approach can be used to map physical quantities such as electric or magnetic fields as well as strain. [10][11][12][13] The popularity of 4DSTEM has raised tremendously due to the improvement of digital cameras, i.e. direct detectors are capable of recording several thousand diffraction patterns per second -an acquisition rate to which the presented method has proven to be applicable.…”
Section: Comparison With Hardware Synchronizationmentioning
confidence: 99%