2012
DOI: 10.1016/j.matchar.2012.05.004
|View full text |Cite
|
Sign up to set email alerts
|

Multiscale microstructural characterization of Sn-rich alloys by three dimensional (3D) X-ray synchrotron tomography and focused ion beam (FIB) tomography

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
5

Citation Types

0
18
0

Year Published

2012
2012
2018
2018

Publication Types

Select...
9
1

Relationship

0
10

Authors

Journals

citations
Cited by 26 publications
(18 citation statements)
references
References 25 publications
0
18
0
Order By: Relevance
“…It provides high resolution images (on the order of 10 nm) along with a large enough volume to provide statistically accurate information of nano-scale precipitates. FIB tomography has already been successfully utilized to characterize the microstructure in Al-SiC nanolaminates [33], Pb-free solders [34,35], and superalloys [36,37].…”
Section: Introductionmentioning
confidence: 99%
“…It provides high resolution images (on the order of 10 nm) along with a large enough volume to provide statistically accurate information of nano-scale precipitates. FIB tomography has already been successfully utilized to characterize the microstructure in Al-SiC nanolaminates [33], Pb-free solders [34,35], and superalloys [36,37].…”
Section: Introductionmentioning
confidence: 99%
“…Both SRCT and SRCL are used with a large variety of contrast modes such as phase contrast (Cloetens et al, 1999;Weitkamp et al, 2005;Harasse et al, 2011;Altapova et al, 2012), fluorescence (de Jonge & Vogt, 2010;Xu et al, 2012a) and diffraction contrast (Ludwig et al, 2008;Hä nschke et al, 2012) which have many applications in materials research (Yazzie et al, 2012;Boden et al, 2014), microsystem technology, cultural heritage, paleontology (Riedel et al, 2012) and biology (Walker et al, 2014; de Kamp et al, 2015;Greven et al, 2015).…”
Section: Introductionmentioning
confidence: 99%
“…They simulated the mechanical and thermal properties of these composites by finite element modeling and successfully compared their model results to conventional compression and thermal expansion tests. In another study of non-destructive test methods, Yazzie et al (2012) used 3D X-ray synchrotron tomography and focused ion beam tomography to visualize and quantify Sn-3.5Ag, Sn-0.7Cu, and Sn-37Pb solder joints. Xu et al (2014) used a reconstruction algorithm methodology to construct 3D microstructures of samples based on 2D images at the microscale.…”
Section: Introductionmentioning
confidence: 99%