Multispectral IR thermotransmittance technique for temperature measurement

Abstract

The goal of this w ork is to reinforce the recent observed giant sensitivity of thermotransmittanc e technique in far infrared w avelength (millimetric one) by transposing such technique in the mid infrared region. Here, the thermotransmittance coefficient determined at IR multiw avelength from 3 to 5 µm and for several semi-transparent media (Silicon, Sapphire) is reported. The major result is the sensitivity dependency of the transmittance coefficient to the IR spectrum of studied material as w ell as the good relative sensitivity. As a consequence tomographic and non-contact multispectral temperature measurement could be considered w ith this method.