The paper presents a method for microscanning two-layer patterns of matrix photodetectors based on silicon. The developed systems register the visible and infrared spectra. Various methods of microscanning with the developed multispectral matrix photodetectors are proposed. Two colors are recorded in each cell, which simplifies the interpolation process, and using the microscanning technology, can eliminate it. For the obtained subpixels, the interpolation algorithm is reduced. In this case, the direction of a matrix shift should be taken into account when performing microscanning. For staggered cell patterns, the choice of direction is not as critical as for pseudo-random or vertical/horizontal arrangement. When microscanning, the direction of matrix shift should be taken into account. For staggered cell patterns, the choice of direction is not as critical as for pseudo-random or vertical/horizontal arrangement. So, for example, a pseudo-random arrangement is suitable for recording images of nature, where there are many small details of various shapes; and vertical/horizontal arrangement is suitable for scenes of the city and industrial areas, where everything has clear vertical and horizontal lines. The very idea of microscanning with a shift of half a pixel makes it possible to fill the "blind" zones of the matrix - pixel binding - on four sides of the pixel itself, which leads to a 4-fold increase in color resolution. For the obtained subpixels, a linear or adaptive interpolation method is suitable. It is also possible to take a more complicated path and choose bicubic, biharmonic interpolation. However, this approach contradicts the very concept of simplifying the image processing algorithm, although it leads to high-contrast color resolutions. Such systems can be used in surveys where it is necessary to record the exact details of a terrain or object, for example, in aerial photography and photogrammetry.