2019
DOI: 10.1002/smr.2203
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Multitask defect prediction

Abstract: Within‐project defect prediction assumes that we have sufficient labeled data from the same project, while cross‐project defect prediction assumes that we have plenty of labeled data from source projects. However, in practice, we might only have limited labeled data from both the source and target projects in some scenarios. In this paper, we want to apply multitask learning to investigate such a new scenario. To our best knowledge, this problem (ie, both the source project and the target project have limited … Show more

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Cited by 7 publications
(1 citation statement)
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References 69 publications
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“…Based on the SVP process analysis, it is not hard to find that this research topic is mainly motivated by SDP [4,[11][12][13][14][15][16][17]. Vulnerabilities and defects have a certain similarity [2].…”
Section: Background Of Svpmentioning
confidence: 99%
“…Based on the SVP process analysis, it is not hard to find that this research topic is mainly motivated by SDP [4,[11][12][13][14][15][16][17]. Vulnerabilities and defects have a certain similarity [2].…”
Section: Background Of Svpmentioning
confidence: 99%